Quantum metrology, imaging, and communication:
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Bibliographic Details
Main Authors: Simon, David S. (Author), Jaeger, Gregg (Author), Sergienko, Alexander V. (Author)
Format: Book
Language:English
Published: Cham Springer [2017]
Series:Quantum science and technology
Subjects:
Physical Description:xii, 273 Seiten Diagramme (teilweise farbig)
ISBN:9783319465517
9783319465494

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