Reflection high-energy electron diffraction:
Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This 2004 book serves as an introduction to RHEED for beginners and describes de...
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| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cambridge
Cambridge University Press
2004
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| Subjects: | |
| Online Access: | BSB01 FHN01 Volltext |
| Summary: | Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This 2004 book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth |
| Item Description: | Title from publisher's bibliographic system (viewed on 05 Oct 2015) |
| Physical Description: | 1 online resource (xi, 353 pages) |
| ISBN: | 9780511735097 |
| DOI: | 10.1017/CBO9780511735097 |
Staff View
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| 520 | |a Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This 2004 book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth | ||
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Record in the Search Index
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| author | Ichimiya, Ayahiko 1940- |
| author_facet | Ichimiya, Ayahiko 1940- |
| author_role | aut |
| author_sort | Ichimiya, Ayahiko 1940- |
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| bvnumber | BV043945699 |
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| contents | Historical survey -- Instrumentation -- Wave properties of electrons -- The diffraction conditions -- Geometrical features of the pattern -- Kikuchi and resonance patterns -- Real diffraction patterns -- Electron scattering by atoms -- Kinematic electron diffraction -- Fourier components of the crystal potential -- Dynamical theory : transfer matrix method -- Dynamical theory : embedded R-matrix method -- Dynamical theory : integral method -- Structural analysis of crystal surfaces -- Inelastic scattering in a crystal -- Weakly disordered surfaces -- Strongly disordered surfaces -- RHEED intensity oscillations |
| ctrlnum | (ZDB-20-CBO)CR9780511735097 (OCoLC)850760254 (DE-599)BVBBV043945699 |
| dewey-full | 530.4/275 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.4/275 |
| dewey-search | 530.4/275 |
| dewey-sort | 3530.4 3275 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1017/CBO9780511735097 |
| format | Electronic eBook |
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| id | DE-604.BV043945699 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:39:24Z |
| institution | BVB |
| isbn | 9780511735097 |
| language | English |
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| owner_facet | DE-12 DE-92 |
| physical | 1 online resource (xi, 353 pages) |
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| publishDate | 2004 |
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| spelling | Ichimiya, Ayahiko 1940- Verfasser aut Reflection high-energy electron diffraction Ayahiko Ichimiya and Philip I. Cohen Cambridge Cambridge University Press 2004 1 online resource (xi, 353 pages) txt rdacontent c rdamedia cr rdacarrier Title from publisher's bibliographic system (viewed on 05 Oct 2015) Historical survey -- Instrumentation -- Wave properties of electrons -- The diffraction conditions -- Geometrical features of the pattern -- Kikuchi and resonance patterns -- Real diffraction patterns -- Electron scattering by atoms -- Kinematic electron diffraction -- Fourier components of the crystal potential -- Dynamical theory : transfer matrix method -- Dynamical theory : embedded R-matrix method -- Dynamical theory : integral method -- Structural analysis of crystal surfaces -- Inelastic scattering in a crystal -- Weakly disordered surfaces -- Strongly disordered surfaces -- RHEED intensity oscillations Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This 2004 book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth Reflection high energy electron diffraction Thin films / Surfaces / Analysis Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Molekularstrahlepitaxie (DE-588)4170399-6 gnd rswk-swf RHEED (DE-588)4295703-5 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf RHEED (DE-588)4295703-5 s Oberflächenanalyse (DE-588)4172243-7 s Dünne Schicht (DE-588)4136925-7 s Molekularstrahlepitaxie (DE-588)4170399-6 s 1\p DE-604 Cohen, Philip I. Sonstige oth Erscheint auch als Druckausgabe 978-0-521-18402-1 Erscheint auch als Druckausgabe 978-0-521-45373-8 https://doi.org/10.1017/CBO9780511735097 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Ichimiya, Ayahiko 1940- Reflection high-energy electron diffraction Historical survey -- Instrumentation -- Wave properties of electrons -- The diffraction conditions -- Geometrical features of the pattern -- Kikuchi and resonance patterns -- Real diffraction patterns -- Electron scattering by atoms -- Kinematic electron diffraction -- Fourier components of the crystal potential -- Dynamical theory : transfer matrix method -- Dynamical theory : embedded R-matrix method -- Dynamical theory : integral method -- Structural analysis of crystal surfaces -- Inelastic scattering in a crystal -- Weakly disordered surfaces -- Strongly disordered surfaces -- RHEED intensity oscillations Reflection high energy electron diffraction Thin films / Surfaces / Analysis Dünne Schicht (DE-588)4136925-7 gnd Molekularstrahlepitaxie (DE-588)4170399-6 gnd RHEED (DE-588)4295703-5 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4136925-7 (DE-588)4170399-6 (DE-588)4295703-5 (DE-588)4172243-7 |
| title | Reflection high-energy electron diffraction |
| title_auth | Reflection high-energy electron diffraction |
| title_exact_search | Reflection high-energy electron diffraction |
| title_full | Reflection high-energy electron diffraction Ayahiko Ichimiya and Philip I. Cohen |
| title_fullStr | Reflection high-energy electron diffraction Ayahiko Ichimiya and Philip I. Cohen |
| title_full_unstemmed | Reflection high-energy electron diffraction Ayahiko Ichimiya and Philip I. Cohen |
| title_short | Reflection high-energy electron diffraction |
| title_sort | reflection high energy electron diffraction |
| topic | Reflection high energy electron diffraction Thin films / Surfaces / Analysis Dünne Schicht (DE-588)4136925-7 gnd Molekularstrahlepitaxie (DE-588)4170399-6 gnd RHEED (DE-588)4295703-5 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | Reflection high energy electron diffraction Thin films / Surfaces / Analysis Dünne Schicht Molekularstrahlepitaxie RHEED Oberflächenanalyse |
| url | https://doi.org/10.1017/CBO9780511735097 |
| work_keys_str_mv | AT ichimiyaayahiko reflectionhighenergyelectrondiffraction AT cohenphilipi reflectionhighenergyelectrondiffraction |