Surface analysis of polymers by XPS and static SIMS:
This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge
Cambridge University Press
1998
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| Schriftenreihe: | Cambridge solid state science series
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| Schlagworte: | |
| Online-Zugang: | BSB01 FHN01 Volltext |
| Zusammenfassung: | This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis |
| Beschreibung: | Title from publisher's bibliographic system (viewed on 05 Oct 2015) |
| Beschreibung: | 1 online resource (xiv, 198 pages) |
| ISBN: | 9780511525261 |
| DOI: | 10.1017/CBO9780511525261 |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Briggs, D. 1948- |
| author_facet | Briggs, D. 1948- |
| author_role | aut |
| author_sort | Briggs, D. 1948- |
| author_variant | d b db |
| building | Verbundindex |
| bvnumber | BV043942327 |
| classification_rvk | UV 3300 UV 8000 |
| collection | ZDB-20-CBO |
| contents | Introduction XPS Information from polymer XPS Static SIMS (SSIMS) Information from SSIMS Polymer surface analysis case studies |
| ctrlnum | (ZDB-20-CBO)CR9780511525261 (OCoLC)849910526 (DE-599)BVBBV043942327 |
| dewey-full | 547.7046 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 547 - Organic chemistry |
| dewey-raw | 547.7046 |
| dewey-search | 547.7046 |
| dewey-sort | 3547.7046 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| doi_str_mv | 10.1017/CBO9780511525261 |
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| id | DE-604.BV043942327 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:39:17Z |
| institution | BVB |
| isbn | 9780511525261 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029351297 |
| oclc_num | 849910526 |
| open_access_boolean | |
| owner | DE-12 DE-92 |
| owner_facet | DE-12 DE-92 |
| physical | 1 online resource (xiv, 198 pages) |
| psigel | ZDB-20-CBO ZDB-20-CBO BSB_PDA_CBO ZDB-20-CBO FHN_PDA_CBO |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Cambridge University Press |
| record_format | marc |
| series2 | Cambridge solid state science series |
| spelling | Briggs, D. 1948- Verfasser aut Surface analysis of polymers by XPS and static SIMS D. Briggs Surface Analysis of Polymers by XPS & Static SIMS Cambridge Cambridge University Press 1998 1 online resource (xiv, 198 pages) txt rdacontent c rdamedia cr rdacarrier Cambridge solid state science series Title from publisher's bibliographic system (viewed on 05 Oct 2015) Ch. 1 Introduction Ch. 2 XPS Ch. 3 Information from polymer XPS Ch. 4 Static SIMS (SSIMS) Ch. 5 Information from SSIMS Ch. 6 Polymer surface analysis case studies This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis Polymers / Surfaces / Analysis X-ray spectroscopy Secondary ion mass spectrometry Röntgenspektroskopie (DE-588)4050331-8 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Ionenmassenspektrometer (DE-588)4162324-1 gnd rswk-swf Polymere (DE-588)4046699-1 gnd rswk-swf Polymere (DE-588)4046699-1 s Oberflächenanalyse (DE-588)4172243-7 s Röntgenspektroskopie (DE-588)4050331-8 s Ionenmassenspektrometer (DE-588)4162324-1 s 1\p DE-604 Erscheint auch als Druckausgabe 978-0-521-01753-4 Erscheint auch als Druckausgabe 978-0-521-35222-2 https://doi.org/10.1017/CBO9780511525261 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Briggs, D. 1948- Surface analysis of polymers by XPS and static SIMS Introduction XPS Information from polymer XPS Static SIMS (SSIMS) Information from SSIMS Polymer surface analysis case studies Polymers / Surfaces / Analysis X-ray spectroscopy Secondary ion mass spectrometry Röntgenspektroskopie (DE-588)4050331-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Ionenmassenspektrometer (DE-588)4162324-1 gnd Polymere (DE-588)4046699-1 gnd |
| subject_GND | (DE-588)4050331-8 (DE-588)4172243-7 (DE-588)4162324-1 (DE-588)4046699-1 |
| title | Surface analysis of polymers by XPS and static SIMS |
| title_alt | Surface Analysis of Polymers by XPS & Static SIMS Introduction XPS Information from polymer XPS Static SIMS (SSIMS) Information from SSIMS Polymer surface analysis case studies |
| title_auth | Surface analysis of polymers by XPS and static SIMS |
| title_exact_search | Surface analysis of polymers by XPS and static SIMS |
| title_full | Surface analysis of polymers by XPS and static SIMS D. Briggs |
| title_fullStr | Surface analysis of polymers by XPS and static SIMS D. Briggs |
| title_full_unstemmed | Surface analysis of polymers by XPS and static SIMS D. Briggs |
| title_short | Surface analysis of polymers by XPS and static SIMS |
| title_sort | surface analysis of polymers by xps and static sims |
| topic | Polymers / Surfaces / Analysis X-ray spectroscopy Secondary ion mass spectrometry Röntgenspektroskopie (DE-588)4050331-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd Ionenmassenspektrometer (DE-588)4162324-1 gnd Polymere (DE-588)4046699-1 gnd |
| topic_facet | Polymers / Surfaces / Analysis X-ray spectroscopy Secondary ion mass spectrometry Röntgenspektroskopie Oberflächenanalyse Ionenmassenspektrometer Polymere |
| url | https://doi.org/10.1017/CBO9780511525261 |
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