Nonlinear transistor model parameter extraction techniques:
Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty...
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge
Cambridge University Press
2012
|
| Schriftenreihe: | The Cambridge RF and microwave engineering series
|
| Schlagworte: | |
| Online-Zugang: | BSB01 FHN01 Volltext |
| Zusammenfassung: | Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction |
| Beschreibung: | Title from publisher's bibliographic system (viewed on 05 Oct 2015) |
| Beschreibung: | 1 online resource (xiv, 352 pages) |
| ISBN: | 9781139014960 |
| DOI: | 10.1017/CBO9781139014960 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043940506 | ||
| 003 | DE-604 | ||
| 005 | 20220517 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 161206s2012 |||| o||u| ||||||eng d | ||
| 020 | |a 9781139014960 |c Online |9 978-1-139-01496-0 | ||
| 024 | 7 | |a 10.1017/CBO9781139014960 |2 doi | |
| 035 | |a (ZDB-20-CBO)CR9781139014960 | ||
| 035 | |a (OCoLC)982086490 | ||
| 035 | |a (DE-599)BVBBV043940506 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 |a DE-92 | ||
| 082 | 0 | |a 621.3815/28 |2 23 | |
| 084 | |a ZN 4850 |0 (DE-625)157413: |2 rvk | ||
| 245 | 1 | 0 | |a Nonlinear transistor model parameter extraction techniques |c edited by Matthias Rudolph, Christian Fager, David E. Root |
| 264 | 1 | |a Cambridge |b Cambridge University Press |c 2012 | |
| 300 | |a 1 online resource (xiv, 352 pages) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a The Cambridge RF and microwave engineering series | |
| 500 | |a Title from publisher's bibliographic system (viewed on 05 Oct 2015) | ||
| 520 | |a Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction | ||
| 650 | 4 | |a Mathematisches Modell | |
| 650 | 4 | |a Transistors / Mathematical models | |
| 650 | 4 | |a Electronic circuit design | |
| 700 | 1 | |a Rudolph, Matthias |d 1969- |0 (DE-588)123731771 |4 edt | |
| 700 | 1 | |a Fager, Christian |4 edt | |
| 700 | 1 | |a Root, David E. |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-0-521-76210-6 |
| 856 | 4 | 0 | |u https://doi.org/10.1017/CBO9781139014960 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-20-CBO | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029349476 | ||
| 966 | e | |u https://doi.org/10.1017/CBO9781139014960 |l BSB01 |p ZDB-20-CBO |q BSB_PDA_CBO |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1017/CBO9781139014960 |l FHN01 |p ZDB-20-CBO |q FHN_PDA_CBO |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804176881139843072 |
|---|---|
| any_adam_object | |
| author2 | Rudolph, Matthias 1969- Fager, Christian Root, David E. |
| author2_role | edt edt edt |
| author2_variant | m r mr c f cf d e r de der |
| author_GND | (DE-588)123731771 |
| author_facet | Rudolph, Matthias 1969- Fager, Christian Root, David E. |
| building | Verbundindex |
| bvnumber | BV043940506 |
| classification_rvk | ZN 4850 |
| collection | ZDB-20-CBO |
| ctrlnum | (ZDB-20-CBO)CR9781139014960 (OCoLC)982086490 (DE-599)BVBBV043940506 |
| dewey-full | 621.3815/28 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/28 |
| dewey-search | 621.3815/28 |
| dewey-sort | 3621.3815 228 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1017/CBO9781139014960 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02669nmm a2200457zc 4500</leader><controlfield tag="001">BV043940506</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220517 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">161206s2012 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781139014960</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-139-01496-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1017/CBO9781139014960</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-20-CBO)CR9781139014960</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)982086490</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043940506</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/28</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4850</subfield><subfield code="0">(DE-625)157413:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Nonlinear transistor model parameter extraction techniques</subfield><subfield code="c">edited by Matthias Rudolph, Christian Fager, David E. Root</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cambridge</subfield><subfield code="b">Cambridge University Press</subfield><subfield code="c">2012</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xiv, 352 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">The Cambridge RF and microwave engineering series</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Title from publisher's bibliographic system (viewed on 05 Oct 2015)</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mathematisches Modell</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Transistors / Mathematical models</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuit design</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rudolph, Matthias</subfield><subfield code="d">1969-</subfield><subfield code="0">(DE-588)123731771</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Fager, Christian</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Root, David E.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-0-521-76210-6</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1017/CBO9781139014960</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-20-CBO</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029349476</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1017/CBO9781139014960</subfield><subfield code="l">BSB01</subfield><subfield code="p">ZDB-20-CBO</subfield><subfield code="q">BSB_PDA_CBO</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1017/CBO9781139014960</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-20-CBO</subfield><subfield code="q">FHN_PDA_CBO</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043940506 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:39:13Z |
| institution | BVB |
| isbn | 9781139014960 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029349476 |
| oclc_num | 982086490 |
| open_access_boolean | |
| owner | DE-12 DE-92 |
| owner_facet | DE-12 DE-92 |
| physical | 1 online resource (xiv, 352 pages) |
| psigel | ZDB-20-CBO ZDB-20-CBO BSB_PDA_CBO ZDB-20-CBO FHN_PDA_CBO |
| publishDate | 2012 |
| publishDateSearch | 2012 |
| publishDateSort | 2012 |
| publisher | Cambridge University Press |
| record_format | marc |
| series2 | The Cambridge RF and microwave engineering series |
| spelling | Nonlinear transistor model parameter extraction techniques edited by Matthias Rudolph, Christian Fager, David E. Root Cambridge Cambridge University Press 2012 1 online resource (xiv, 352 pages) txt rdacontent c rdamedia cr rdacarrier The Cambridge RF and microwave engineering series Title from publisher's bibliographic system (viewed on 05 Oct 2015) Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction Mathematisches Modell Transistors / Mathematical models Electronic circuit design Rudolph, Matthias 1969- (DE-588)123731771 edt Fager, Christian edt Root, David E. edt Erscheint auch als Druckausgabe 978-0-521-76210-6 https://doi.org/10.1017/CBO9781139014960 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Nonlinear transistor model parameter extraction techniques Mathematisches Modell Transistors / Mathematical models Electronic circuit design |
| title | Nonlinear transistor model parameter extraction techniques |
| title_auth | Nonlinear transistor model parameter extraction techniques |
| title_exact_search | Nonlinear transistor model parameter extraction techniques |
| title_full | Nonlinear transistor model parameter extraction techniques edited by Matthias Rudolph, Christian Fager, David E. Root |
| title_fullStr | Nonlinear transistor model parameter extraction techniques edited by Matthias Rudolph, Christian Fager, David E. Root |
| title_full_unstemmed | Nonlinear transistor model parameter extraction techniques edited by Matthias Rudolph, Christian Fager, David E. Root |
| title_short | Nonlinear transistor model parameter extraction techniques |
| title_sort | nonlinear transistor model parameter extraction techniques |
| topic | Mathematisches Modell Transistors / Mathematical models Electronic circuit design |
| topic_facet | Mathematisches Modell Transistors / Mathematical models Electronic circuit design |
| url | https://doi.org/10.1017/CBO9781139014960 |
| work_keys_str_mv | AT rudolphmatthias nonlineartransistormodelparameterextractiontechniques AT fagerchristian nonlineartransistormodelparameterextractiontechniques AT rootdavide nonlineartransistormodelparameterextractiontechniques |