Zhang, W. (2017). Measurement technology for micro-nanometer devices. John Wiley & Sons, Inc.
Chicago Style (17th ed.) CitationZhang, Wendong. Measurement Technology for Micro-nanometer Devices. Solaris South Tower, Singapore: John Wiley & Sons, Inc, 2017.
MLA (9th ed.) CitationZhang, Wendong. Measurement Technology for Micro-nanometer Devices. John Wiley & Sons, Inc, 2017.
Warning: These citations may not always be 100% accurate.