An essential guide to electronic material surfaces and interfaces:
"An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and de...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Hoboken, New Jersey
John Wiley & Sons, Inc.
[2016]
|
| Schlagworte: | |
| Online-Zugang: | FRO01 UBG01 URL des Erstveröffentlichers |
| Zusammenfassung: | "An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them. Starting with the fundamental electronic properties of semiconductors and electrical measurements of semiconductor interfaces, this text introduces students to the importance of characterizing and controlling macroscopic electrical properties by atomic-scale techniques. The chapters that follow present the full range of surface and interface techniques now being used to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth for students to master the fundamental principles, with numerous examples to illustrate the strengths and limitations for specific applications. As well as references to the most authoritative sources for broader discussions, the text includes internet links to additional examples, mathematical derivations, tables, and literature references for the advanced student, as well as professionals in these fields. This textbook fills a gap in the existing literature for an entry-level course that provides the physical properties, experimental techniques, and theoretical methods essential for students and professionals to understand and participate in solid-state electronics, physics, and materials science research"-- |
| Beschreibung: | 1 online resource |
| ISBN: | 111902711X 1119027128 1119027136 1119027144 9781119027119 9781119027126 9781119027133 9781119027140 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043863589 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 161107s2016 |||| o||u| ||||||eng d | ||
| 020 | |a 111902711X |9 1-119-02711-X | ||
| 020 | |a 1119027128 |9 1-119-02712-8 | ||
| 020 | |a 1119027136 |9 1-119-02713-6 | ||
| 020 | |a 1119027144 |9 1-119-02714-4 | ||
| 020 | |a 9781119027119 |9 978-1-119-02711-9 | ||
| 020 | |a 9781119027126 |9 978-1-119-02712-6 | ||
| 020 | |a 9781119027133 |c Online |9 978-1-119-02713-3 | ||
| 020 | |a 9781119027140 |9 978-1-119-02714-0 | ||
| 035 | |a (ZDB-35-WIC)ocn942611368 | ||
| 035 | |a (OCoLC)953285283 | ||
| 035 | |a (DE-599)BVBBV043863589 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-861 | ||
| 082 | 0 | |a 621.381 | |
| 084 | |a UP 4500 |0 (DE-625)146401: |2 rvk | ||
| 084 | |a UP 7500 |0 (DE-625)146433: |2 rvk | ||
| 084 | |a VE 7000 |0 (DE-625)147134:253 |2 rvk | ||
| 084 | |a ZN 3400 |0 (DE-625)157307: |2 rvk | ||
| 100 | 1 | |a Brillson, L. J. |4 aut | |
| 245 | 1 | 0 | |a An essential guide to electronic material surfaces and interfaces |c by Leonard J. Brillson, Ohio State University |
| 264 | 1 | |a Hoboken, New Jersey |b John Wiley & Sons, Inc. |c [2016] | |
| 300 | |a 1 online resource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 505 | 8 | |a Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces | |
| 520 | |a "An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them. Starting with the fundamental electronic properties of semiconductors and electrical measurements of semiconductor interfaces, this text introduces students to the importance of characterizing and controlling macroscopic electrical properties by atomic-scale techniques. The chapters that follow present the full range of surface and interface techniques now being used to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth for students to master the fundamental principles, with numerous examples to illustrate the strengths and limitations for specific applications. As well as references to the most authoritative sources for broader discussions, the text includes internet links to additional examples, mathematical derivations, tables, and literature references for the advanced student, as well as professionals in these fields. This textbook fills a gap in the existing literature for an entry-level course that provides the physical properties, experimental techniques, and theoretical methods essential for students and professionals to understand and participate in solid-state electronics, physics, and materials science research"-- | ||
| 650 | 7 | |a Electronics / Materials |2 fast | |
| 650 | 7 | |a Semiconductors / Materials |2 fast | |
| 650 | 7 | |a Spectrum analysis |2 fast | |
| 650 | 7 | |a Surfaces (Technology) / Analysis |2 fast | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Mechanical |2 bisacsh | |
| 650 | 4 | |a Electronics / Materials | |
| 650 | 4 | |a Surfaces (Technology) / Analysis | |
| 650 | 4 | |a Spectrum analysis | |
| 650 | 4 | |a Semiconductors / Materials | |
| 650 | 0 | 7 | |a Grenzflächenphysik |0 (DE-588)4452968-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Grenzflächenchemie |0 (DE-588)4246080-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oberflächenchemie |0 (DE-588)4126166-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oberflächenphysik |0 (DE-588)4134881-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Oberflächenphysik |0 (DE-588)4134881-3 |D s |
| 689 | 0 | 1 | |a Oberflächenchemie |0 (DE-588)4126166-5 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Grenzflächenphysik |0 (DE-588)4452968-5 |D s |
| 689 | 1 | 1 | |a Grenzflächenchemie |0 (DE-588)4246080-3 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-1-119-02711-9 |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9781119027140 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-35-WIC | ||
| 940 | 1 | |q UBG_PDA_WIC | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029273634 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9781119027140 |l FRO01 |p ZDB-35-WIC |q FRO_PDA_WIC |x Verlag |3 Volltext | |
| 966 | e | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9781119027140 |l UBG01 |p ZDB-35-WIC |q UBG_PDA_WIC |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804176746266755072 |
|---|---|
| any_adam_object | |
| author | Brillson, L. J. |
| author_facet | Brillson, L. J. |
| author_role | aut |
| author_sort | Brillson, L. J. |
| author_variant | l j b lj ljb |
| building | Verbundindex |
| bvnumber | BV043863589 |
| classification_rvk | UP 4500 UP 7500 VE 7000 ZN 3400 |
| collection | ZDB-35-WIC |
| contents | Includes bibliographical references and index Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces |
| ctrlnum | (ZDB-35-WIC)ocn942611368 (OCoLC)953285283 (DE-599)BVBBV043863589 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>05455nmm a2200769zc 4500</leader><controlfield tag="001">BV043863589</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">161107s2016 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">111902711X</subfield><subfield code="9">1-119-02711-X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1119027128</subfield><subfield code="9">1-119-02712-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1119027136</subfield><subfield code="9">1-119-02713-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1119027144</subfield><subfield code="9">1-119-02714-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119027119</subfield><subfield code="9">978-1-119-02711-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119027126</subfield><subfield code="9">978-1-119-02712-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119027133</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-119-02713-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119027140</subfield><subfield code="9">978-1-119-02714-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-35-WIC)ocn942611368</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)953285283</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043863589</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-861</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 4500</subfield><subfield code="0">(DE-625)146401:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7500</subfield><subfield code="0">(DE-625)146433:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VE 7000</subfield><subfield code="0">(DE-625)147134:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 3400</subfield><subfield code="0">(DE-625)157307:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Brillson, L. J.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">An essential guide to electronic material surfaces and interfaces</subfield><subfield code="c">by Leonard J. Brillson, Ohio State University</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, New Jersey</subfield><subfield code="b">John Wiley & Sons, Inc.</subfield><subfield code="c">[2016]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">"An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them. Starting with the fundamental electronic properties of semiconductors and electrical measurements of semiconductor interfaces, this text introduces students to the importance of characterizing and controlling macroscopic electrical properties by atomic-scale techniques. The chapters that follow present the full range of surface and interface techniques now being used to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth for students to master the fundamental principles, with numerous examples to illustrate the strengths and limitations for specific applications. As well as references to the most authoritative sources for broader discussions, the text includes internet links to additional examples, mathematical derivations, tables, and literature references for the advanced student, as well as professionals in these fields. This textbook fills a gap in the existing literature for an entry-level course that provides the physical properties, experimental techniques, and theoretical methods essential for students and professionals to understand and participate in solid-state electronics, physics, and materials science research"--</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electronics / Materials</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconductors / Materials</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Spectrum analysis</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Surfaces (Technology) / Analysis</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Mechanical</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics / Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Technology) / Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectrum analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors / Materials</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Grenzflächenphysik</subfield><subfield code="0">(DE-588)4452968-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Grenzflächenchemie</subfield><subfield code="0">(DE-588)4246080-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Oberflächenchemie</subfield><subfield code="0">(DE-588)4126166-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Oberflächenphysik</subfield><subfield code="0">(DE-588)4134881-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Oberflächenphysik</subfield><subfield code="0">(DE-588)4134881-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Oberflächenchemie</subfield><subfield code="0">(DE-588)4126166-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Grenzflächenphysik</subfield><subfield code="0">(DE-588)4452968-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Grenzflächenchemie</subfield><subfield code="0">(DE-588)4246080-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-1-119-02711-9</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119027140</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WIC</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">UBG_PDA_WIC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029273634</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119027140</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">FRO_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119027140</subfield><subfield code="l">UBG01</subfield><subfield code="p">ZDB-35-WIC</subfield><subfield code="q">UBG_PDA_WIC</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043863589 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:37:05Z |
| institution | BVB |
| isbn | 111902711X 1119027128 1119027136 1119027144 9781119027119 9781119027126 9781119027133 9781119027140 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029273634 |
| oclc_num | 942611368 953285283 |
| open_access_boolean | |
| owner | DE-861 |
| owner_facet | DE-861 |
| physical | 1 online resource |
| psigel | ZDB-35-WIC UBG_PDA_WIC ZDB-35-WIC FRO_PDA_WIC ZDB-35-WIC UBG_PDA_WIC |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | John Wiley & Sons, Inc. |
| record_format | marc |
| spelling | Brillson, L. J. aut An essential guide to electronic material surfaces and interfaces by Leonard J. Brillson, Ohio State University Hoboken, New Jersey John Wiley & Sons, Inc. [2016] 1 online resource txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces "An Essential Guide to Electronic Material Surfaces and Interfaces is a streamlined yet comprehensive introduction that covers the basic physical properties of electronic materials, the experimental techniques used to measure them, and the theoretical methods used to understand, predict, and design them. Starting with the fundamental electronic properties of semiconductors and electrical measurements of semiconductor interfaces, this text introduces students to the importance of characterizing and controlling macroscopic electrical properties by atomic-scale techniques. The chapters that follow present the full range of surface and interface techniques now being used to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth for students to master the fundamental principles, with numerous examples to illustrate the strengths and limitations for specific applications. As well as references to the most authoritative sources for broader discussions, the text includes internet links to additional examples, mathematical derivations, tables, and literature references for the advanced student, as well as professionals in these fields. This textbook fills a gap in the existing literature for an entry-level course that provides the physical properties, experimental techniques, and theoretical methods essential for students and professionals to understand and participate in solid-state electronics, physics, and materials science research"-- Electronics / Materials fast Semiconductors / Materials fast Spectrum analysis fast Surfaces (Technology) / Analysis fast TECHNOLOGY & ENGINEERING / Mechanical bisacsh Electronics / Materials Surfaces (Technology) / Analysis Spectrum analysis Semiconductors / Materials Grenzflächenphysik (DE-588)4452968-5 gnd rswk-swf Grenzflächenchemie (DE-588)4246080-3 gnd rswk-swf Oberflächenchemie (DE-588)4126166-5 gnd rswk-swf Oberflächenphysik (DE-588)4134881-3 gnd rswk-swf Oberflächenphysik (DE-588)4134881-3 s Oberflächenchemie (DE-588)4126166-5 s 1\p DE-604 Grenzflächenphysik (DE-588)4452968-5 s Grenzflächenchemie (DE-588)4246080-3 s 2\p DE-604 Erscheint auch als Druckausgabe 978-1-119-02711-9 https://onlinelibrary.wiley.com/doi/book/10.1002/9781119027140 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Brillson, L. J. An essential guide to electronic material surfaces and interfaces Includes bibliographical references and index Why surfaces and interfaces of electronic materials -- Semiconductor electronic and optical properties -- Electrical measurements of surfaces and interfaces -- Localized states at surfaces and interfaces -- Ultrahigh vacuum technology -- Surface and interface analysis -- Surface and interface spectroscopies -- Dynamical depth-dependent analysis and imaging -- Electron beam diffraction and microscopy of atomic-scale geometrical structure -- Scanning probe techniques -- Optical spectroscopies -- Electronic material surfaces -- Surface electronic applications -- Semiconductor heterojunctions -- Metal-semiconductor interfaces -- Next generation surfaces and interfaces Electronics / Materials fast Semiconductors / Materials fast Spectrum analysis fast Surfaces (Technology) / Analysis fast TECHNOLOGY & ENGINEERING / Mechanical bisacsh Electronics / Materials Surfaces (Technology) / Analysis Spectrum analysis Semiconductors / Materials Grenzflächenphysik (DE-588)4452968-5 gnd Grenzflächenchemie (DE-588)4246080-3 gnd Oberflächenchemie (DE-588)4126166-5 gnd Oberflächenphysik (DE-588)4134881-3 gnd |
| subject_GND | (DE-588)4452968-5 (DE-588)4246080-3 (DE-588)4126166-5 (DE-588)4134881-3 |
| title | An essential guide to electronic material surfaces and interfaces |
| title_auth | An essential guide to electronic material surfaces and interfaces |
| title_exact_search | An essential guide to electronic material surfaces and interfaces |
| title_full | An essential guide to electronic material surfaces and interfaces by Leonard J. Brillson, Ohio State University |
| title_fullStr | An essential guide to electronic material surfaces and interfaces by Leonard J. Brillson, Ohio State University |
| title_full_unstemmed | An essential guide to electronic material surfaces and interfaces by Leonard J. Brillson, Ohio State University |
| title_short | An essential guide to electronic material surfaces and interfaces |
| title_sort | an essential guide to electronic material surfaces and interfaces |
| topic | Electronics / Materials fast Semiconductors / Materials fast Spectrum analysis fast Surfaces (Technology) / Analysis fast TECHNOLOGY & ENGINEERING / Mechanical bisacsh Electronics / Materials Surfaces (Technology) / Analysis Spectrum analysis Semiconductors / Materials Grenzflächenphysik (DE-588)4452968-5 gnd Grenzflächenchemie (DE-588)4246080-3 gnd Oberflächenchemie (DE-588)4126166-5 gnd Oberflächenphysik (DE-588)4134881-3 gnd |
| topic_facet | Electronics / Materials Semiconductors / Materials Spectrum analysis Surfaces (Technology) / Analysis TECHNOLOGY & ENGINEERING / Mechanical Grenzflächenphysik Grenzflächenchemie Oberflächenchemie Oberflächenphysik |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9781119027140 |
| work_keys_str_mv | AT brillsonlj anessentialguidetoelectronicmaterialsurfacesandinterfaces |