Vector network analyzer (VNA) measurements and uncertainty assessment:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham
Springer
[2017]
|
| Series: | PoliTO Springer Series
|
| Subjects: | |
| Online Access: | BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 TUM01 UBY01 Volltext |
| Physical Description: | 1 Online-Ressource (xiv, 82 Seiten) Illustrationen |
| ISBN: | 9783319447728 |
| ISSN: | 2509-6796 |
| DOI: | 10.1007/978-3-319-44772-8 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043862314 | ||
| 003 | DE-604 | ||
| 005 | 20180409 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 161107s2017 |||| o||u| ||||||eng d | ||
| 020 | |a 9783319447728 |c Online |9 978-3-319-44772-8 | ||
| 024 | 7 | |a 10.1007/978-3-319-44772-8 |2 doi | |
| 035 | |a (ZDB-2-ENG)9783319447728 | ||
| 035 | |a (OCoLC)960015576 | ||
| 035 | |a (DE-599)BVBBV043862314 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-859 |a DE-1046 |a DE-860 |a DE-898 |a DE-706 |a DE-92 |a DE-1043 |a DE-91 |a DE-634 |a DE-Aug4 |a DE-861 |a DE-863 |a DE-862 |a DE-573 | ||
| 082 | 0 | |a 621.3 |2 23 | |
| 084 | |a ZN 5330 |0 (DE-625)157447: |2 rvk | ||
| 084 | |a ZQ 3420 |0 (DE-625)158057: |2 rvk | ||
| 084 | |a MAS 000 |2 stub | ||
| 084 | |a ELT 000 |2 stub | ||
| 100 | 1 | |a Shoaib, Nosherwan |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Vector network analyzer (VNA) measurements and uncertainty assessment |c Nosherwan Shoaib |
| 264 | 1 | |a Cham |b Springer |c [2017] | |
| 300 | |a 1 Online-Ressource (xiv, 82 Seiten) |b Illustrationen | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a PoliTO Springer Series |x 2509-6796 | |
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Physical measurements | |
| 650 | 4 | |a Measurement | |
| 650 | 4 | |a Microwaves | |
| 650 | 4 | |a Optical engineering | |
| 650 | 4 | |a Electronic circuits | |
| 650 | 4 | |a Microwaves, RF and Optical Engineering | |
| 650 | 4 | |a Measurement Science and Instrumentation | |
| 650 | 4 | |a Circuits and Systems | |
| 650 | 4 | |a Ingenieurwissenschaften | |
| 776 | 1 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-319-44771-1 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-319-44772-8 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 940 | 1 | |q ZDB-2-ENG_2017 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029272388 | ||
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FAB01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FAW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FHA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FKE01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FLA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FRO01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FWS01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l FWS02 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l TUM01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-319-44772-8 |l UBY01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
Record in the Search Index
| DE-BY-FWS_katkey | 630554 |
|---|---|
| _version_ | 1824554553060622337 |
| any_adam_object | |
| author | Shoaib, Nosherwan |
| author_facet | Shoaib, Nosherwan |
| author_role | aut |
| author_sort | Shoaib, Nosherwan |
| author_variant | n s ns |
| building | Verbundindex |
| bvnumber | BV043862314 |
| classification_rvk | ZN 5330 ZQ 3420 |
| classification_tum | MAS 000 ELT 000 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)9783319447728 (OCoLC)960015576 (DE-599)BVBBV043862314 |
| dewey-full | 621.3 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3 |
| dewey-search | 621.3 |
| dewey-sort | 3621.3 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik Maschinenbau |
| doi_str_mv | 10.1007/978-3-319-44772-8 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03140nmm a2200685zc 4500</leader><controlfield tag="001">BV043862314</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180409 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">161107s2017 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319447728</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-319-44772-8</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-319-44772-8</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9783319447728</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)960015576</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043862314</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-859</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-573</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 5330</subfield><subfield code="0">(DE-625)157447:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZQ 3420</subfield><subfield code="0">(DE-625)158057:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shoaib, Nosherwan</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Vector network analyzer (VNA) measurements and uncertainty assessment</subfield><subfield code="c">Nosherwan Shoaib</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield><subfield code="c">[2017]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xiv, 82 Seiten)</subfield><subfield code="b">Illustrationen</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">PoliTO Springer Series</subfield><subfield code="x">2509-6796</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical measurements</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microwaves</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microwaves, RF and Optical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Measurement Science and Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="776" ind1="1" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-319-44771-1</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2017</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029272388</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FAB01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-44772-8</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043862314 |
| illustrated | Not Illustrated |
| indexdate | 2025-02-20T06:53:36Z |
| institution | BVB |
| isbn | 9783319447728 |
| issn | 2509-6796 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029272388 |
| oclc_num | 960015576 |
| open_access_boolean | |
| owner | DE-859 DE-1046 DE-860 DE-898 DE-BY-UBR DE-706 DE-92 DE-1043 DE-91 DE-BY-TUM DE-634 DE-Aug4 DE-861 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-573 |
| owner_facet | DE-859 DE-1046 DE-860 DE-898 DE-BY-UBR DE-706 DE-92 DE-1043 DE-91 DE-BY-TUM DE-634 DE-Aug4 DE-861 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-573 |
| physical | 1 Online-Ressource (xiv, 82 Seiten) Illustrationen |
| psigel | ZDB-2-ENG ZDB-2-ENG_2017 |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | Springer |
| record_format | marc |
| series2 | PoliTO Springer Series |
| spellingShingle | Shoaib, Nosherwan Vector network analyzer (VNA) measurements and uncertainty assessment Engineering Physical measurements Measurement Microwaves Optical engineering Electronic circuits Microwaves, RF and Optical Engineering Measurement Science and Instrumentation Circuits and Systems Ingenieurwissenschaften |
| title | Vector network analyzer (VNA) measurements and uncertainty assessment |
| title_auth | Vector network analyzer (VNA) measurements and uncertainty assessment |
| title_exact_search | Vector network analyzer (VNA) measurements and uncertainty assessment |
| title_full | Vector network analyzer (VNA) measurements and uncertainty assessment Nosherwan Shoaib |
| title_fullStr | Vector network analyzer (VNA) measurements and uncertainty assessment Nosherwan Shoaib |
| title_full_unstemmed | Vector network analyzer (VNA) measurements and uncertainty assessment Nosherwan Shoaib |
| title_short | Vector network analyzer (VNA) measurements and uncertainty assessment |
| title_sort | vector network analyzer vna measurements and uncertainty assessment |
| topic | Engineering Physical measurements Measurement Microwaves Optical engineering Electronic circuits Microwaves, RF and Optical Engineering Measurement Science and Instrumentation Circuits and Systems Ingenieurwissenschaften |
| topic_facet | Engineering Physical measurements Measurement Microwaves Optical engineering Electronic circuits Microwaves, RF and Optical Engineering Measurement Science and Instrumentation Circuits and Systems Ingenieurwissenschaften |
| url | https://doi.org/10.1007/978-3-319-44772-8 |
| work_keys_str_mv | AT shoaibnosherwan vectornetworkanalyzervnameasurementsanduncertaintyassessment |