Verfügbarkeit: Occupational injuries from electrical shock and arc flash events

Occupational injuries from electrical shock and arc flash events:

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Bibliographische Detailangaben
Hauptverfasser:	Campbell, Richard B. (VerfasserIn), Dini, David A. (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	[New York, NY] Springer [2016]
Schriftenreihe:	SpringerBriefs in fire
Schlagworte:	Engineering Quality control Reliability Industrial safety Building materials Electronics Microelectronics Quality Control, Reliability, Safety and Risk Electronics and Microelectronics, Instrumentation Building Materials Ingenieurwissenschaften
Online-Zugang:	BTU01 FHA01 FHI01 FHM01 FHN01 FHR01 FKE01 FRO01 HTW01 UBG01 UBM01 UBR01 UBT01 UBW01 UER01 UPA01 URL des Erstveröffentlichers
Beschreibung:	1 Online-Ressource (XX, 78 Seiten, 29 illus. in color)
ISBN:	9781493965083
ISSN:	2193-6595
DOI:	10.1007/978-1-4939-6508-3

Internformat

MARC


LEADER	00000nmm a2200000zc 4500
001	BV043831260
003	DE-604
005	20161202
007	cr\|uuu---uuuuu
008	161018s2016 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 9781493965083 \|c Online \|9 978-1-4939-6508-3
024	7		\|a 10.1007/978-1-4939-6508-3 \|2 doi
035			\|a (ZDB-2-SCS)9781493965083
035			\|a (OCoLC)959988553
035			\|a (DE-599)BVBBV043831260
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-355 \|a DE-19 \|a DE-Aug4 \|a DE-898 \|a DE-861 \|a DE-523 \|a DE-859 \|a DE-473 \|a DE-29 \|a DE-20 \|a DE-92 \|a DE-573 \|a DE-M347 \|a DE-703 \|a DE-739 \|a DE-634
082	0		\|a 658.56 \|2 23
100	1		\|a Campbell, Richard B. \|e Verfasser \|4 aut
245	1	0	\|a Occupational injuries from electrical shock and arc flash events \|c Richard B. Campbell, David A. Dini
264		1	\|a [New York, NY] \|b Springer \|c [2016]
300			\|a 1 Online-Ressource (XX, 78 Seiten, 29 illus. in color)
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
490	0		\|a SpringerBriefs in fire \|x 2193-6595
650		4	\|a Engineering
650		4	\|a Quality control
650		4	\|a Reliability
650		4	\|a Industrial safety
650		4	\|a Building materials
650		4	\|a Electronics
650		4	\|a Microelectronics
650		4	\|a Quality Control, Reliability, Safety and Risk
650		4	\|a Electronics and Microelectronics, Instrumentation
650		4	\|a Building Materials
650		4	\|a Ingenieurwissenschaften
700	1		\|a Dini, David A. \|e Verfasser \|4 aut
776	0	8	\|i Erscheint auch als \|n Druckausgabe \|z 978-1-4939-6507-6
856	4	0	\|u https://doi.org/10.1007/978-1-4939-6508-3 \|x Verlag \|z URL des Erstveröffentlichers \|3 Volltext
912			\|a ZDB-2-SCS
940	1		\|q ZDB-2-SCS_2016
999			\|a oai:aleph.bib-bvb.de:BVB01-029242031
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l BTU01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l FHA01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l FHI01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l FHM01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l FHN01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l FHR01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l FKE01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l FRO01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l HTW01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l UBG01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l UBM01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l UBR01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l UBT01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l UBW01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l UER01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-1-4939-6508-3 \|l UPA01 \|p ZDB-2-SCS \|x Verlag \|3 Volltext

Datensatz im Suchindex

_version_	1804176693914501120
any_adam_object
author	Campbell, Richard B. Dini, David A.
author_facet	Campbell, Richard B. Dini, David A.
author_role	aut aut
author_sort	Campbell, Richard B.
author_variant	r b c rb rbc d a d da dad
building	Verbundindex
bvnumber	BV043831260
collection	ZDB-2-SCS
ctrlnum	(ZDB-2-SCS)9781493965083 (OCoLC)959988553 (DE-599)BVBBV043831260
dewey-full	658.56
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	658 - General management
dewey-raw	658.56
dewey-search	658.56
dewey-sort	3658.56
dewey-tens	650 - Management and auxiliary services
discipline	Informatik Wirtschaftswissenschaften
doi_str_mv	10.1007/978-1-4939-6508-3
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03304nmm a2200685zc 4500</leader><controlfield tag="001">BV043831260</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20161202 </controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">161018s2016 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781493965083</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-4939-6508-3</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4939-6508-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-SCS)9781493965083</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)959988553</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043831260</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield><subfield code="a">DE-19</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-473</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">658.56</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Campbell, Richard B.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Occupational injuries from electrical shock and arc flash events</subfield><subfield code="c">Richard B. Campbell, David A. Dini</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">[New York, NY]</subfield><subfield code="b">Springer</subfield><subfield code="c">[2016]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XX, 78 Seiten, 29 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">SpringerBriefs in fire</subfield><subfield code="x">2193-6595</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality control</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Industrial safety</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Building materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality Control, Reliability, Safety and Risk</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Building Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dini, David A.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-1-4939-6507-6</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-SCS</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-SCS_2016</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029242031</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">FHM01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">HTW01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">UBG01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">UBR01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">UBT01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">UBW01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">UER01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-6508-3</subfield><subfield code="l">UPA01</subfield><subfield code="p">ZDB-2-SCS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id	DE-604.BV043831260
illustrated	Not Illustrated
indexdate	2024-07-10T07:36:15Z
institution	BVB
isbn	9781493965083
issn	2193-6595
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-029242031
oclc_num	959988553
open_access_boolean
owner	DE-355 DE-BY-UBR DE-19 DE-BY-UBM DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-473 DE-BY-UBG DE-29 DE-20 DE-92 DE-573 DE-M347 DE-703 DE-739 DE-634
owner_facet	DE-355 DE-BY-UBR DE-19 DE-BY-UBM DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-473 DE-BY-UBG DE-29 DE-20 DE-92 DE-573 DE-M347 DE-703 DE-739 DE-634
physical	1 Online-Ressource (XX, 78 Seiten, 29 illus. in color)
psigel	ZDB-2-SCS ZDB-2-SCS_2016
publishDate	2016
publishDateSearch	2016
publishDateSort	2016
publisher	Springer
record_format	marc
series2	SpringerBriefs in fire
spelling	Campbell, Richard B. Verfasser aut Occupational injuries from electrical shock and arc flash events Richard B. Campbell, David A. Dini [New York, NY] Springer [2016] 1 Online-Ressource (XX, 78 Seiten, 29 illus. in color) txt rdacontent c rdamedia cr rdacarrier SpringerBriefs in fire 2193-6595 Engineering Quality control Reliability Industrial safety Building materials Electronics Microelectronics Quality Control, Reliability, Safety and Risk Electronics and Microelectronics, Instrumentation Building Materials Ingenieurwissenschaften Dini, David A. Verfasser aut Erscheint auch als Druckausgabe 978-1-4939-6507-6 https://doi.org/10.1007/978-1-4939-6508-3 Verlag URL des Erstveröffentlichers Volltext
spellingShingle	Campbell, Richard B. Dini, David A. Occupational injuries from electrical shock and arc flash events Engineering Quality control Reliability Industrial safety Building materials Electronics Microelectronics Quality Control, Reliability, Safety and Risk Electronics and Microelectronics, Instrumentation Building Materials Ingenieurwissenschaften
title	Occupational injuries from electrical shock and arc flash events
title_auth	Occupational injuries from electrical shock and arc flash events
title_exact_search	Occupational injuries from electrical shock and arc flash events
title_full	Occupational injuries from electrical shock and arc flash events Richard B. Campbell, David A. Dini
title_fullStr	Occupational injuries from electrical shock and arc flash events Richard B. Campbell, David A. Dini
title_full_unstemmed	Occupational injuries from electrical shock and arc flash events Richard B. Campbell, David A. Dini
title_short	Occupational injuries from electrical shock and arc flash events
title_sort	occupational injuries from electrical shock and arc flash events
topic	Engineering Quality control Reliability Industrial safety Building materials Electronics Microelectronics Quality Control, Reliability, Safety and Risk Electronics and Microelectronics, Instrumentation Building Materials Ingenieurwissenschaften
topic_facet	Engineering Quality control Reliability Industrial safety Building materials Electronics Microelectronics Quality Control, Reliability, Safety and Risk Electronics and Microelectronics, Instrumentation Building Materials Ingenieurwissenschaften
url	https://doi.org/10.1007/978-1-4939-6508-3
work_keys_str_mv	AT campbellrichardb occupationalinjuriesfromelectricalshockandarcflashevents AT dinidavida occupationalinjuriesfromelectricalshockandarcflashevents

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