APA (7th ed.) Citation

IFIP/IEEE International Conference on Very Large Scale Integration Daejon, Shin, Y., Tsui, C. Y., Kim, J., Choi, K., & Reis, R. (2016). VLSI-SoC: design for reliability, security, and low power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015 : revised selected papers. Springer. https://doi.org/10.1007/978-3-319-46097-0

Chicago Style (17th ed.) Citation

IFIP/IEEE International Conference on Very Large Scale Integration Daejon, Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Ki-Young Choi, and Ricardo Reis. VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015 : Revised Selected Papers. [Cham]: Springer, 2016. https://doi.org/10.1007/978-3-319-46097-0.

MLA (9th ed.) Citation

IFIP/IEEE International Conference on Very Large Scale Integration Daejon, et al. VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015 : Revised Selected Papers. Springer, 2016. https://doi.org/10.1007/978-3-319-46097-0.