Strain and dislocation gradients from diffraction: spatially-resolved local structure and defects
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| Other Authors: | , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
London
Imperial College Press
2014
|
| Subjects: | |
| Online Access: | FAW01 FAW02 |
| Item Description: | Description based on online resource; title from PDF title page (ebrary, viewed May 27, 2014) |
| Physical Description: | 1 online resource (478 pages) illustrations |
| ISBN: | 9781908979629 9781908979636 1908979631 1908979623 |
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| 505 | 8 | |a Ch. 1. Diffraction analysis of defects: State of the art / Rozaliya I. Barabash and Gene E. Ice -- ch. 2. X-ray Laue diffraction microscopy in 3D at the advanced photon source / Wenjun Liu and Gene E. Ice -- ch. 3. High-energy transmission Laue (HETL) micro-beam diffraction / Felix Hofmann and Alexander M. Korsunsky -- ch. 4. XMAS: A versatile tool for analyzing synchrotron X-ray microdiffraction data / Nobumichi Tamura -- ch. 5. Laue microdiffraction at the ESRF / Odile Robach ... [et al.] -- ch. 6. 3D X-ray diffraction microscopy / Henning Friis Poulsen ... [et al.] -- ch. 7. Grain centre mapping -- 3DXRD measurements of average grain characteristic / Jette Oddershede -- ch. 8. Three-dimensional X-ray diffraction (3DXRD) imaging techniques / Wolfgang Ludwig, Andrew King and Peter Reischig -- ch. 9. High-resolution reciprocal space mapping for characterizing deformation structures / Wolfgang Pantleon ... [et al.] -- ch. 10. Reconstructing 2D and 3D X-ray orientation maps from white-beam Laue / Jonathan Z. Tischler -- ch. 11. Energy-variable X-ray diffraction for studying polycrystalline materials with high depth resolution / Emil Zolotoyabko -- ch. 12. Microstructure detail extraction via EBSD: An overview / David Fullwood -- ch. 13. High-pressure studies with microdiffraction / Wenge Yang | |
| 505 | 8 | |a This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating | |
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| contents | Ch. 1. Diffraction analysis of defects: State of the art / Rozaliya I. Barabash and Gene E. Ice -- ch. 2. X-ray Laue diffraction microscopy in 3D at the advanced photon source / Wenjun Liu and Gene E. Ice -- ch. 3. High-energy transmission Laue (HETL) micro-beam diffraction / Felix Hofmann and Alexander M. Korsunsky -- ch. 4. XMAS: A versatile tool for analyzing synchrotron X-ray microdiffraction data / Nobumichi Tamura -- ch. 5. Laue microdiffraction at the ESRF / Odile Robach ... [et al.] -- ch. 6. 3D X-ray diffraction microscopy / Henning Friis Poulsen ... [et al.] -- ch. 7. Grain centre mapping -- 3DXRD measurements of average grain characteristic / Jette Oddershede -- ch. 8. Three-dimensional X-ray diffraction (3DXRD) imaging techniques / Wolfgang Ludwig, Andrew King and Peter Reischig -- ch. 9. High-resolution reciprocal space mapping for characterizing deformation structures / Wolfgang Pantleon ... [et al.] -- ch. 10. Reconstructing 2D and 3D X-ray orientation maps from white-beam Laue / Jonathan Z. Tischler -- ch. 11. Energy-variable X-ray diffraction for studying polycrystalline materials with high depth resolution / Emil Zolotoyabko -- ch. 12. Microstructure detail extraction via EBSD: An overview / David Fullwood -- ch. 13. High-pressure studies with microdiffraction / Wenge Yang This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating |
| ctrlnum | (ZDB-4-EBA)ocn882246370 (OCoLC)882246370 (DE-599)BVBBV043781514 |
| dewey-full | 539.7222 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 539 - Modern physics |
| dewey-raw | 539.7222 |
| dewey-search | 539.7222 |
| dewey-sort | 3539.7222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
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| id | DE-604.BV043781514 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:34:57Z |
| institution | BVB |
| isbn | 9781908979629 9781908979636 1908979631 1908979623 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029192574 |
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| physical | 1 online resource (478 pages) illustrations |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 2014 |
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| publisher | Imperial College Press |
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| spelling | Strain and dislocation gradients from diffraction spatially-resolved local structure and defects editors, Rozaliya Barabash, Gene Ice London Imperial College Press 2014 © 2014 1 online resource (478 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Description based on online resource; title from PDF title page (ebrary, viewed May 27, 2014) Ch. 1. Diffraction analysis of defects: State of the art / Rozaliya I. Barabash and Gene E. Ice -- ch. 2. X-ray Laue diffraction microscopy in 3D at the advanced photon source / Wenjun Liu and Gene E. Ice -- ch. 3. High-energy transmission Laue (HETL) micro-beam diffraction / Felix Hofmann and Alexander M. Korsunsky -- ch. 4. XMAS: A versatile tool for analyzing synchrotron X-ray microdiffraction data / Nobumichi Tamura -- ch. 5. Laue microdiffraction at the ESRF / Odile Robach ... [et al.] -- ch. 6. 3D X-ray diffraction microscopy / Henning Friis Poulsen ... [et al.] -- ch. 7. Grain centre mapping -- 3DXRD measurements of average grain characteristic / Jette Oddershede -- ch. 8. Three-dimensional X-ray diffraction (3DXRD) imaging techniques / Wolfgang Ludwig, Andrew King and Peter Reischig -- ch. 9. High-resolution reciprocal space mapping for characterizing deformation structures / Wolfgang Pantleon ... [et al.] -- ch. 10. Reconstructing 2D and 3D X-ray orientation maps from white-beam Laue / Jonathan Z. Tischler -- ch. 11. Energy-variable X-ray diffraction for studying polycrystalline materials with high depth resolution / Emil Zolotoyabko -- ch. 12. Microstructure detail extraction via EBSD: An overview / David Fullwood -- ch. 13. High-pressure studies with microdiffraction / Wenge Yang This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating SCIENCE / Physics / Crystallography bisacsh X-rays / Diffraction fast X-rays / Diffraction X-rays Diffraction Kristallstrukturanalyse (DE-588)4137204-9 gnd rswk-swf Versetzung Kristallographie (DE-588)4187993-4 gnd rswk-swf Beugung (DE-588)4145094-2 gnd rswk-swf Kristallstrukturanalyse (DE-588)4137204-9 s Beugung (DE-588)4145094-2 s 1\p DE-604 Versetzung Kristallographie (DE-588)4187993-4 s 2\p DE-604 Barabash, Rozaliya edt Ice, Gene edt Erscheint auch als Druck-Ausgabe Strain and dislocation gradients from diffraction : spatially-resolved local structure and defects 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Strain and dislocation gradients from diffraction spatially-resolved local structure and defects Ch. 1. Diffraction analysis of defects: State of the art / Rozaliya I. Barabash and Gene E. Ice -- ch. 2. X-ray Laue diffraction microscopy in 3D at the advanced photon source / Wenjun Liu and Gene E. Ice -- ch. 3. High-energy transmission Laue (HETL) micro-beam diffraction / Felix Hofmann and Alexander M. Korsunsky -- ch. 4. XMAS: A versatile tool for analyzing synchrotron X-ray microdiffraction data / Nobumichi Tamura -- ch. 5. Laue microdiffraction at the ESRF / Odile Robach ... [et al.] -- ch. 6. 3D X-ray diffraction microscopy / Henning Friis Poulsen ... [et al.] -- ch. 7. Grain centre mapping -- 3DXRD measurements of average grain characteristic / Jette Oddershede -- ch. 8. Three-dimensional X-ray diffraction (3DXRD) imaging techniques / Wolfgang Ludwig, Andrew King and Peter Reischig -- ch. 9. High-resolution reciprocal space mapping for characterizing deformation structures / Wolfgang Pantleon ... [et al.] -- ch. 10. Reconstructing 2D and 3D X-ray orientation maps from white-beam Laue / Jonathan Z. Tischler -- ch. 11. Energy-variable X-ray diffraction for studying polycrystalline materials with high depth resolution / Emil Zolotoyabko -- ch. 12. Microstructure detail extraction via EBSD: An overview / David Fullwood -- ch. 13. High-pressure studies with microdiffraction / Wenge Yang This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating SCIENCE / Physics / Crystallography bisacsh X-rays / Diffraction fast X-rays / Diffraction X-rays Diffraction Kristallstrukturanalyse (DE-588)4137204-9 gnd Versetzung Kristallographie (DE-588)4187993-4 gnd Beugung (DE-588)4145094-2 gnd |
| subject_GND | (DE-588)4137204-9 (DE-588)4187993-4 (DE-588)4145094-2 |
| title | Strain and dislocation gradients from diffraction spatially-resolved local structure and defects |
| title_auth | Strain and dislocation gradients from diffraction spatially-resolved local structure and defects |
| title_exact_search | Strain and dislocation gradients from diffraction spatially-resolved local structure and defects |
| title_full | Strain and dislocation gradients from diffraction spatially-resolved local structure and defects editors, Rozaliya Barabash, Gene Ice |
| title_fullStr | Strain and dislocation gradients from diffraction spatially-resolved local structure and defects editors, Rozaliya Barabash, Gene Ice |
| title_full_unstemmed | Strain and dislocation gradients from diffraction spatially-resolved local structure and defects editors, Rozaliya Barabash, Gene Ice |
| title_short | Strain and dislocation gradients from diffraction |
| title_sort | strain and dislocation gradients from diffraction spatially resolved local structure and defects |
| title_sub | spatially-resolved local structure and defects |
| topic | SCIENCE / Physics / Crystallography bisacsh X-rays / Diffraction fast X-rays / Diffraction X-rays Diffraction Kristallstrukturanalyse (DE-588)4137204-9 gnd Versetzung Kristallographie (DE-588)4187993-4 gnd Beugung (DE-588)4145094-2 gnd |
| topic_facet | SCIENCE / Physics / Crystallography X-rays / Diffraction X-rays Diffraction Kristallstrukturanalyse Versetzung Kristallographie Beugung |
| work_keys_str_mv | AT barabashrozaliya strainanddislocationgradientsfromdiffractionspatiallyresolvedlocalstructureanddefects AT icegene strainanddislocationgradientsfromdiffractionspatiallyresolvedlocalstructureanddefects |