Metrology and Physical Mechanisms in New Generation Ionic Devices:
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Electronic eBook |
| Language: | English |
| Published: |
Cham
Springer
[2016]
|
| Series: | Springer Theses
|
| Subjects: | |
| Online Access: | TUM01 UBT01 Volltext |
| Physical Description: | 1 Online-Ressource (XXIV, 175 p. 96 illus., 18 illus. in color) |
| ISBN: | 9783319395319 |
| DOI: | 10.1007/978-3-319-39531-9 |
Staff View
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Record in the Search Index
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| ctrlnum | (ZDB-2-PHA)978-3-319-39531-9 (OCoLC)953114828 (DE-599)BVBBV043650391 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV043650391 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:31:32Z |
| institution | BVB |
| isbn | 9783319395319 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029063998 |
| oclc_num | 953114828 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-703 |
| owner_facet | DE-91 DE-BY-TUM DE-703 |
| physical | 1 Online-Ressource (XXIV, 175 p. 96 illus., 18 illus. in color) |
| psigel | ZDB-2-PHA ZDB-2-PHA_2016 |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Springer |
| record_format | marc |
| series2 | Springer Theses |
| spelling | Celano, Umberto Verfasser aut Metrology and Physical Mechanisms in New Generation Ionic Devices Umberto Celano Cham Springer [2016] 1 Online-Ressource (XXIV, 175 p. 96 illus., 18 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Theses Dissertation KU Leuven and IMEC, Belgium Physics Spectroscopy Microscopy Nanotechnology Materials science Spectroscopy and Microscopy Nanotechnology and Microengineering Characterization and Evaluation of Materials (DE-588)4113937-9 Hochschulschrift gnd-content Erscheint auch als Druckausgabe 978-3-319-39530-2 https://doi.org/10.1007/978-3-319-39531-9 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Celano, Umberto Metrology and Physical Mechanisms in New Generation Ionic Devices Physics Spectroscopy Microscopy Nanotechnology Materials science Spectroscopy and Microscopy Nanotechnology and Microengineering Characterization and Evaluation of Materials |
| subject_GND | (DE-588)4113937-9 |
| title | Metrology and Physical Mechanisms in New Generation Ionic Devices |
| title_auth | Metrology and Physical Mechanisms in New Generation Ionic Devices |
| title_exact_search | Metrology and Physical Mechanisms in New Generation Ionic Devices |
| title_full | Metrology and Physical Mechanisms in New Generation Ionic Devices Umberto Celano |
| title_fullStr | Metrology and Physical Mechanisms in New Generation Ionic Devices Umberto Celano |
| title_full_unstemmed | Metrology and Physical Mechanisms in New Generation Ionic Devices Umberto Celano |
| title_short | Metrology and Physical Mechanisms in New Generation Ionic Devices |
| title_sort | metrology and physical mechanisms in new generation ionic devices |
| topic | Physics Spectroscopy Microscopy Nanotechnology Materials science Spectroscopy and Microscopy Nanotechnology and Microengineering Characterization and Evaluation of Materials |
| topic_facet | Physics Spectroscopy Microscopy Nanotechnology Materials science Spectroscopy and Microscopy Nanotechnology and Microengineering Characterization and Evaluation of Materials Hochschulschrift |
| url | https://doi.org/10.1007/978-3-319-39531-9 |
| work_keys_str_mv | AT celanoumberto metrologyandphysicalmechanismsinnewgenerationionicdevices |