Holdings: Soft error mechanisms, modeling and mitigation

Soft error mechanisms, modeling and mitigation:

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Bibliographic Details
Main Author:	Sayil, Selahattin (Author)
Format:	Electronic eBook
Language:	English
Published:	[Cham] Springer International Publishing [2016]
Subjects:	Engineering Microprocessors Electronic circuits Circuits and Systems Electronic Circuits and Devices Processor Architectures Ingenieurwissenschaften
Online Access:	BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FRO01 FWS01 FWS02 UBY01 Volltext Abstract Inhaltsverzeichnis
Physical Description:	1 Online Ressource (xi, 105 p. 81 illus., 35 illus. in color)
ISBN:	9783319306070
DOI:	10.1007/978-3-319-30607-0

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Record in the Search Index

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adam_text	SOFT ERROR MECHANISMS, MODELING AND MITIGATION / SAYIL, SELAHATTIN : 2016 ABSTRACT / INHALTSTEXT THIS BOOK INTRODUCES READERS TO VARIOUS RADIATION SOFT-ERROR MECHANISMS SUCH AS SOFT DELAYS, RADIATION INDUCED CLOCK JITTER AND PULSES, AND SINGLE EVENT (SE) COUPLING INDUCED EFFECTS. IN ADDITION TO DISCUSSING VARIOUS RADIATION HARDENING TECHNIQUES FOR COMBINATIONAL LOGIC, THE AUTHOR ALSO DESCRIBES NEW MITIGATION STRATEGIES TARGETING COMMERCIAL DESIGNS. COVERAGE INCLUDES NOVEL SOFT ERROR MITIGATION TECHNIQUES SUCH AS THE DYNAMIC THRESHOLD TECHNIQUE AND SOFT ERROR FILTERING BASED ON TRANSMISSION GATE WITH VARIED GATE AND BODY BIAS. THE DISCUSSION ALSO INCLUDES MODELING OF SE CROSSTALK NOISE, DELAY AND SPEED-UP EFFECTS. VARIOUS MITIGATION STRATEGIES TO ELIMINATE SE COUPLING EFFECTS ARE ALSO INTRODUCED. COVERAGE ALSO INCLUDES THE RELIABILITY OF LOW POWER ENERGY-EFFICIENT DESIGNS AND THE IMPACT OF LEAKAGE POWER CONSUMPTION OPTIMIZATIONS ON SOFT ERROR ROBUSTNESS. THE AUTHOR PRESENTS AN ANALYSIS OF VARIOUS POWER OPTIMIZATION TECHNIQUES, ENABLING READERS TO MAKE DESIGN CHOICES THAT REDUCE STATIC POWER CONSUMPTION AND IMPROVE SOFT ERROR RELIABILITY AT THE SAME TIME. DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT. SOFT ERROR MECHANISMS, MODELING AND MITIGATION / SAYIL, SELAHATTIN : 2016 TABLE OF CONTENTS / INHALTSVERZEICHNIS INTRODUCTION MITIGATION OF SINGLE EVENT EFFECTS TRANSMISSION GATE (TG) BASED SOFT ERROR MITIGATION METHODS SINGLE EVENT SOFT ERROR MECHANISMS MODELING SINGLE EVENT CROSSTALK NOISE IN NANOMETER TECHNOLOGIES MODELING OF SINGLE EVENT COUPLING DELAY AND SPEEDUP EFFECTS SINGLE EVENT UPSET HARDENING OF INTERCONNECTS SOFT-ERROR AWARE POWER OPTIMIZATION DYNAMIC THRESHOLD TECHNIQUE FOR SOFT ERROR AND SOFT DELAY MITIGATION DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
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author	Sayil, Selahattin
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dewey-full	621.3815
dewey-hundreds	600 - Technology (Applied sciences)
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dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
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illustrated	Not Illustrated
indexdate	2025-02-20T06:52:53Z
institution	BVB
isbn	9783319306070
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-028840644
oclc_num	943825537
open_access_boolean
owner	DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-573 DE-859 DE-863 DE-BY-FWS DE-634 DE-92 DE-862 DE-BY-FWS DE-861 DE-706
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physical	1 Online Ressource (xi, 105 p. 81 illus., 35 illus. in color)
psigel	ZDB-2-ENG ZDB-2-ENG_2016
publishDate	2016
publishDateSearch	2016
publishDateSort	2016
publisher	Springer International Publishing
record_format	marc
spellingShingle	Sayil, Selahattin Soft error mechanisms, modeling and mitigation Engineering Microprocessors Electronic circuits Circuits and Systems Electronic Circuits and Devices Processor Architectures Ingenieurwissenschaften
title	Soft error mechanisms, modeling and mitigation
title_auth	Soft error mechanisms, modeling and mitigation
title_exact_search	Soft error mechanisms, modeling and mitigation
title_full	Soft error mechanisms, modeling and mitigation Selahattin Sayil
title_fullStr	Soft error mechanisms, modeling and mitigation Selahattin Sayil
title_full_unstemmed	Soft error mechanisms, modeling and mitigation Selahattin Sayil
title_short	Soft error mechanisms, modeling and mitigation
title_sort	soft error mechanisms modeling and mitigation
topic	Engineering Microprocessors Electronic circuits Circuits and Systems Electronic Circuits and Devices Processor Architectures Ingenieurwissenschaften
topic_facet	Engineering Microprocessors Electronic circuits Circuits and Systems Electronic Circuits and Devices Processor Architectures Ingenieurwissenschaften
url	https://doi.org/10.1007/978-3-319-30607-0 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028840644&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028840644&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA
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