Digital holography for MEMS and microsystem metrology:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Chichester
Wiley
©2011
|
| Schriftenreihe: | Microsystem and nanotechnology series
|
| Schlagworte: | |
| Online-Zugang: | FRO01 UBG01 URL des Erstveröffentlichers |
| Beschreibung: | Approaching the topic of digital holography from the practical perspective of industrial inspection, "Digital Holography for MEMS and Microsystem Metrology" describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes. Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies. Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications. Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xxii, 205 pages) |
| ISBN: | 9781119997290 1119997291 9781119997306 1119997305 1119972787 1119972795 |
Internformat
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| 500 | |a Includes bibliographical references and index | ||
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| dewey-search | 621.381028/7 |
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| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
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| illustrated | Not Illustrated |
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| institution | BVB |
| isbn | 9781119997290 1119997291 9781119997306 1119997305 1119972787 1119972795 |
| language | English |
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| spelling | Digital holography for MEMS and microsystem metrology edited by Anand Asundi Chichester Wiley ©2011 1 Online-Ressource (xxii, 205 pages) txt rdacontent c rdamedia cr rdacarrier Microsystem and nanotechnology series Approaching the topic of digital holography from the practical perspective of industrial inspection, "Digital Holography for MEMS and Microsystem Metrology" describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes. Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies. Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications. Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Microelectromechanical systems / Measurement Microelectronics / Measurement Holographic testing Asundi, Anand Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 978-0-470-97869-6 Erscheint auch als Druck-Ausgabe, Hardcover 0-470-97869-4 https://onlinelibrary.wiley.com/doi/book/10.1002/9781119997290 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Digital holography for MEMS and microsystem metrology TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Microelectromechanical systems / Measurement Microelectronics / Measurement Holographic testing |
| title | Digital holography for MEMS and microsystem metrology |
| title_auth | Digital holography for MEMS and microsystem metrology |
| title_exact_search | Digital holography for MEMS and microsystem metrology |
| title_full | Digital holography for MEMS and microsystem metrology edited by Anand Asundi |
| title_fullStr | Digital holography for MEMS and microsystem metrology edited by Anand Asundi |
| title_full_unstemmed | Digital holography for MEMS and microsystem metrology edited by Anand Asundi |
| title_short | Digital holography for MEMS and microsystem metrology |
| title_sort | digital holography for mems and microsystem metrology |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Microelectromechanical systems / Measurement Microelectronics / Measurement Holographic testing |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Microelectromechanical systems / Measurement Microelectronics / Measurement Holographic testing |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9781119997290 |
| work_keys_str_mv | AT asundianand digitalholographyformemsandmicrosystemmetrology |