X-Ray Spectrometry: Recent Technological Advances - Tsuji, Kouichi (John Wiley Sons, 2004)
During the last decade, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x-ray spectrometry. This progress includes considerable technological improvements in the design and production of detectors as well as significant advances in x-ray optics, special configurations and computing approaches. All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x-ray based analysis techniques for the near future. The book is divided into the following sections:*Introduction*X-Ray Sources*X-Ray Optics*X-Ray Detectors*Special Configurations*New Computerization Methods*New Applicationseach covering the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays. By its nature, such a book cannot cover the fundamental, well-known and more routine aspects of the technique; for this, reference is made to seve ral existing handbooks and textbooks. Each chapter is prepared by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields. This book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others
Includes bibliographical references and index