An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
San Rafael, CA
Morgan & Claypool Publishers
[2015]
Bristol IOP Publishing [2015] |
| Ausgabe: | Version: 20151001 |
| Schriftenreihe: | IOP concise physics
|
| Schlagworte: | |
| Online-Zugang: | UBM01 UBT01 UBW01 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (67 Seiten in getrennter Zählung) Illustrationen, Diagramme |
| ISBN: | 9781681740881 9781681742168 |
| DOI: | 10.1088/978-1-6817-4088-1 |
Internformat
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| 245 | 1 | 0 | |a An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |c Sarah Fearn (Department of Materials, Imperial College, London SW7 2AZ) |
| 250 | |a Version: 20151001 | ||
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Datensatz im Suchindex
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| author | Fearn, Sarah |
| author_facet | Fearn, Sarah |
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| doi_str_mv | 10.1088/978-1-6817-4088-1 |
| edition | Version: 20151001 |
| format | Electronic eBook |
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| id | DE-604.BV043182738 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:19:56Z |
| institution | BVB |
| isbn | 9781681740881 9781681742168 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028606653 |
| oclc_num | 951717598 |
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| owner_facet | DE-19 DE-BY-UBM DE-703 DE-20 |
| physical | 1 Online-Ressource (67 Seiten in getrennter Zählung) Illustrationen, Diagramme |
| psigel | ZDB-135-ICP ZDB-135-ICP_Release2 |
| publishDate | 2015 |
| publishDateSearch | 2015 |
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| publisher | Morgan & Claypool Publishers IOP Publishing |
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| series2 | IOP concise physics |
| spelling | Fearn, Sarah Verfasser aut An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sarah Fearn (Department of Materials, Imperial College, London SW7 2AZ) Version: 20151001 San Rafael, CA Morgan & Claypool Publishers [2015] Bristol IOP Publishing [2015] © 2015 1 Online-Ressource (67 Seiten in getrennter Zählung) Illustrationen, Diagramme txt rdacontent c rdamedia cr rdacarrier IOP concise physics Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s Werkstoffkunde (DE-588)4079184-1 s 1\p DE-604 Erscheint auch als Druckausgabe 978-1-6817-4024-9 https://doi.org/10.1088/978-1-6817-4088-1 Verlag URL des Erstveröffentlichers Volltext Textdatei PDF EPUB HTML 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fearn, Sarah An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)4079184-1 |
| title | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |
| title_auth | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |
| title_exact_search | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |
| title_full | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sarah Fearn (Department of Materials, Imperial College, London SW7 2AZ) |
| title_fullStr | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sarah Fearn (Department of Materials, Imperial College, London SW7 2AZ) |
| title_full_unstemmed | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science Sarah Fearn (Department of Materials, Imperial College, London SW7 2AZ) |
| title_short | An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science |
| title_sort | an introduction to time of flight secondary ion mass spectrometry tof sims and its application to materials science |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Werkstoffkunde |
| url | https://doi.org/10.1088/978-1-6817-4088-1 |
| work_keys_str_mv | AT fearnsarah anintroductiontotimeofflightsecondaryionmassspectrometrytofsimsanditsapplicationtomaterialsscience |