Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
London
Institution of Engineering and Technology
2008
|
| Schriftenreihe: | IET circuits, devices and systems series
19 |
| Schlagworte: | |
| Online-Zugang: | UBY01 Volltext |
| Beschreibung: | Title from title screen Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xx, 389 pages) |
| ISBN: | 9780863419997 0863419992 9780863417450 0863417450 9781615833153 1615833153 |
Internformat
MARC
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| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / General |2 bisacsh | |
| 650 | 4 | |a Linear integrated circuits |x Testing | |
| 650 | 4 | |a Mixed signal circuits |x Testing | |
| 650 | 4 | |a Radio frequency integrated circuits |x Testing | |
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| 689 | 0 | 4 | |a Funktionstest |0 (DE-588)4155698-7 |D s |
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Datensatz im Suchindex
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| building | Verbundindex |
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| dewey-full | 621.38150287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.38150287 |
| dewey-search | 621.38150287 |
| dewey-sort | 3621.38150287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV043168471 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:19:35Z |
| institution | BVB |
| institution_GND | (DE-588)6053948-3 |
| isbn | 9780863419997 0863419992 9780863417450 0863417450 9781615833153 1615833153 |
| language | English |
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| owner_facet | DE-1046 DE-1047 DE-706 |
| physical | 1 Online-Ressource (xx, 389 pages) |
| psigel | ZDB-4-EBA ZDB-100-IET FAW_PDA_EBA |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Institution of Engineering and Technology |
| record_format | marc |
| series2 | IET circuits, devices and systems series |
| spelling | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach edited by Yichuang Sun London Institution of Engineering and Technology 2008 1 Online-Ressource (xx, 389 pages) txt rdacontent c rdamedia cr rdacarrier IET circuits, devices and systems series 19 Title from title screen Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Funktionstest (DE-588)4155698-7 gnd rswk-swf Hochfrequenzschaltung (DE-588)4160147-6 gnd rswk-swf Analoge integrierte Schaltung (DE-588)4112519-8 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Mixed-Signal-Schaltung (DE-588)4756481-7 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Analoge integrierte Schaltung (DE-588)4112519-8 s Mixed-Signal-Schaltung (DE-588)4756481-7 s Hochfrequenzschaltung (DE-588)4160147-6 s Funktionstest (DE-588)4155698-7 s 1\p DE-604 Sun, Yichuang Sonstige oth Institution of Engineering and Technology Sonstige (DE-588)6053948-3 oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=292173 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Funktionstest (DE-588)4155698-7 gnd Hochfrequenzschaltung (DE-588)4160147-6 gnd Analoge integrierte Schaltung (DE-588)4112519-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd |
| subject_GND | (DE-588)4155698-7 (DE-588)4160147-6 (DE-588)4112519-8 (DE-588)4027242-4 (DE-588)4756481-7 |
| title | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_auth | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_exact_search | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach |
| title_full | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach edited by Yichuang Sun |
| title_fullStr | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach edited by Yichuang Sun |
| title_full_unstemmed | Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach edited by Yichuang Sun |
| title_short | Test and diagnosis of analogue, mixed-signal and RF integrated circuits |
| title_sort | test and diagnosis of analogue mixed signal and rf integrated circuits the system on chip approach |
| title_sub | the system on chip approach |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Funktionstest (DE-588)4155698-7 gnd Hochfrequenzschaltung (DE-588)4160147-6 gnd Analoge integrierte Schaltung (DE-588)4112519-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Mixed-Signal-Schaltung (DE-588)4756481-7 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Linear integrated circuits Testing Mixed signal circuits Testing Radio frequency integrated circuits Testing Funktionstest Hochfrequenzschaltung Analoge integrierte Schaltung Integrierte Schaltung Mixed-Signal-Schaltung |
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