Defects-recognition imaging and physics in semiconductors XIV: selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Durnten-Zurich
Trans Tech Publications
c2012
|
| Series: | Materials science forum
v. 725 |
| Subjects: | |
| Online Access: | FAW01 FAW02 Volltext |
| Item Description: | Includes bibliographical references and author index |
| Physical Description: | 1 Online-Ressource (xiii, 299 p.) |
| ISBN: | 3038138568 9783038138563 |
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| spelling | International Conference on Defects: Recognition, Imaging and Physics in Semiconductors <2011, Miyazaki, Japan> Verfasser aut Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan edited by Hiroshi Yamada-Kaneta and Akira Sakai Durnten-Zurich Trans Tech Publications c2012 1 Online-Ressource (xiii, 299 p.) txt rdacontent c rdamedia cr rdacarrier Materials science forum v. 725 Includes bibliographical references and author index TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Image processing fast Semiconductors / Defects fast Semiconductors Defects Congresses Image processing Congresses (DE-588)1071861417 Konferenzschrift gnd-content Yamada-Kaneta, Hiroshi Sonstige oth Sakai, Akira Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215 Aggregator Volltext |
| spellingShingle | Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Image processing fast Semiconductors / Defects fast Semiconductors Defects Congresses Image processing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan |
| title_auth | Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan |
| title_exact_search | Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan |
| title_full | Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan edited by Hiroshi Yamada-Kaneta and Akira Sakai |
| title_fullStr | Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan edited by Hiroshi Yamada-Kaneta and Akira Sakai |
| title_full_unstemmed | Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan edited by Hiroshi Yamada-Kaneta and Akira Sakai |
| title_short | Defects-recognition imaging and physics in semiconductors XIV |
| title_sort | defects recognition imaging and physics in semiconductors xiv selected peer reviewed papers from the 14th international conference on defects recognition imaging and physics in semiconductors september 25 29 2011 miyazaki japan |
| title_sub | selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Image processing fast Semiconductors / Defects fast Semiconductors Defects Congresses Image processing Congresses |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State Image processing Semiconductors / Defects Semiconductors Defects Congresses Image processing Congresses Konferenzschrift |
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