International Conference on Defects: Recognition, Imaging and Physics in Semiconductors <2011, Miyazaki, Japan>. (2012). Defects-recognition imaging and physics in semiconductors XIV: Selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan. Trans Tech Publications.
Chicago Style (17th ed.) CitationInternational Conference on Defects: Recognition, Imaging and Physics in Semiconductors <2011, Miyazaki, Japan>. Defects-recognition Imaging and Physics in Semiconductors XIV: Selected Peer Reviewed Papers from the 14th International Conference on Defects-recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan. Durnten-Zurich: Trans Tech Publications, 2012.
MLA (9th ed.) CitationInternational Conference on Defects: Recognition, Imaging and Physics in Semiconductors <2011, Miyazaki, Japan>. Defects-recognition Imaging and Physics in Semiconductors XIV: Selected Peer Reviewed Papers from the 14th International Conference on Defects-recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan. Trans Tech Publications, 2012.