Microelectronic failure analysis: desk reference : 2002 supplement
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
c2002
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (vi, 210 p.) |
| ISBN: | 0871707691 1615032649 9780871707697 9781615032648 |
Internformat
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| 245 | 1 | 0 | |a Microelectronic failure analysis |b desk reference : 2002 supplement |c prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| 264 | 1 | |a Materials Park, Ohio |b ASM International |c c2002 | |
| 300 | |a 1 Online-Ressource (vi, 210 p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Digital |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Microelectronics |2 bisacsh | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Semiconductors |x Defects |v Handbooks, manuals, etc | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
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Datensatz im Suchindex
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| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV043136083 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:18:33Z |
| institution | BVB |
| isbn | 0871707691 1615032649 9780871707697 9781615032648 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028560274 |
| oclc_num | 609419839 |
| open_access_boolean | |
| owner | DE-1046 DE-1047 |
| owner_facet | DE-1046 DE-1047 |
| physical | 1 Online-Ressource (vi, 210 p.) |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronic failure analysis desk reference : 2002 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee Materials Park, Ohio ASM International c2002 1 Online-Ressource (vi, 210 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc Electronic Device Failure Analysis Society Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=395856 Aggregator Volltext |
| spellingShingle | Microelectronic failure analysis desk reference : 2002 supplement TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| title | Microelectronic failure analysis desk reference : 2002 supplement |
| title_auth | Microelectronic failure analysis desk reference : 2002 supplement |
| title_exact_search | Microelectronic failure analysis desk reference : 2002 supplement |
| title_full | Microelectronic failure analysis desk reference : 2002 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_fullStr | Microelectronic failure analysis desk reference : 2002 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_full_unstemmed | Microelectronic failure analysis desk reference : 2002 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_short | Microelectronic failure analysis |
| title_sort | microelectronic failure analysis desk reference 2002 supplement |
| title_sub | desk reference : 2002 supplement |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
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| work_keys_str_mv | AT electronicdevicefailureanalysissociety microelectronicfailureanalysisdeskreference2002supplement |