X-ray scattering from semiconductors:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
London
Imperial College Press
2000
|
| Subjects: | |
| Online Access: | FAW01 FAW02 Volltext |
| Item Description: | Includes bibliographical references Ch. 1. An introduction to semiconductor materials -- ch. 2. An introduction to X-ray scattering -- ch. 3. Equipment for measuring diffraction patterns -- ch. 4. A practical guide to the evaluation of structural parameters X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc. This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors |
| Physical Description: | 1 Online-Ressource (287 p.) |
| ISBN: | 184816047X 1860941591 9781848160477 9781860941597 |
Staff View
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| 500 | |a Includes bibliographical references | ||
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| 500 | |a X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc. This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors | ||
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| dewey-full | 537.6/22 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/22 |
| dewey-search | 537.6/22 |
| dewey-sort | 3537.6 222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
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| isbn | 184816047X 1860941591 9781848160477 9781860941597 |
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| spelling | Fewster, Paul F. Verfasser aut X-ray scattering from semiconductors Paul F. Fewster London Imperial College Press 2000 1 Online-Ressource (287 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references Ch. 1. An introduction to semiconductor materials -- ch. 2. An introduction to X-ray scattering -- ch. 3. Equipment for measuring diffraction patterns -- ch. 4. A practical guide to the evaluation of structural parameters X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc. This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors Halbleiter swd Röntgenstreuung swd SCIENCE / Physics / Electricity bisacsh Semiconductors fast X-rays / Scattering fast Semiconductors X-rays Scattering Halbleiter (DE-588)4022993-2 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 s Halbleiter (DE-588)4022993-2 s 1\p DE-604 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521314 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fewster, Paul F. X-ray scattering from semiconductors Halbleiter swd Röntgenstreuung swd SCIENCE / Physics / Electricity bisacsh Semiconductors fast X-rays / Scattering fast Semiconductors X-rays Scattering Halbleiter (DE-588)4022993-2 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4178324-4 |
| title | X-ray scattering from semiconductors |
| title_auth | X-ray scattering from semiconductors |
| title_exact_search | X-ray scattering from semiconductors |
| title_full | X-ray scattering from semiconductors Paul F. Fewster |
| title_fullStr | X-ray scattering from semiconductors Paul F. Fewster |
| title_full_unstemmed | X-ray scattering from semiconductors Paul F. Fewster |
| title_short | X-ray scattering from semiconductors |
| title_sort | x ray scattering from semiconductors |
| topic | Halbleiter swd Röntgenstreuung swd SCIENCE / Physics / Electricity bisacsh Semiconductors fast X-rays / Scattering fast Semiconductors X-rays Scattering Halbleiter (DE-588)4022993-2 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| topic_facet | Halbleiter Röntgenstreuung SCIENCE / Physics / Electricity Semiconductors X-rays / Scattering X-rays Scattering |
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