Microelectronics failure analysis: desk reference
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Materials Park, Ohio
ASM International
©2004
|
| Subjects: | |
| Online Access: | FAW01 FAW02 Volltext |
| Item Description: | Includes bibliographical references and indexes Introduction -- - Failure analysis process flow -- - Failure verification -- - Failure mode: failure classifications -- - Special devices -- - Non-destructive analysis techniques -- - Depackaging -- - Photon emission (electroluminescence) localization techniques -- - Microthermography -- - Laser and particle beam-based localization techniques -- - Deprocessing -- - General imaging techniques -- - Local deprocessing and imaging -- - Materials analysis techniques -- - Important topics for semiconductor devices -- - FA techniques/tools roadmaps -- - FA operation and management -- - Appendix |
| Physical Description: | 1 Online-Ressource (xiv, 800 pages) |
| ISBN: | 0871708043 1615032665 9780871708045 9781615032662 |
Staff View
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| 245 | 1 | 0 | |a Microelectronics failure analysis |b desk reference |c edited by the Electronic Device Failure Analysis Society, Desk Reference Committee |
| 264 | 1 | |a Materials Park, Ohio |b ASM International |c ©2004 | |
| 300 | |a 1 Online-Ressource (xiv, 800 pages) | ||
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| 500 | |a Includes bibliographical references and indexes | ||
| 500 | |a Introduction -- - Failure analysis process flow -- - Failure verification -- - Failure mode: failure classifications -- - Special devices -- - Non-destructive analysis techniques -- - Depackaging -- - Photon emission (electroluminescence) localization techniques -- - Microthermography -- - Laser and particle beam-based localization techniques -- - Deprocessing -- - General imaging techniques -- - Local deprocessing and imaging -- - Materials analysis techniques -- - Important topics for semiconductor devices -- - FA techniques/tools roadmaps -- - FA operation and management -- - Appendix | ||
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| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Electronics |x Materials |x Defects |v Handbooks, manuals, etc | |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV043114377 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:17:52Z |
| institution | BVB |
| isbn | 0871708043 1615032665 9780871708045 9781615032662 |
| language | English |
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| oclc_num | 297826771 |
| open_access_boolean | |
| owner | DE-1046 DE-1047 |
| owner_facet | DE-1046 DE-1047 |
| physical | 1 Online-Ressource (xiv, 800 pages) |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronics failure analysis desk reference edited by the Electronic Device Failure Analysis Society, Desk Reference Committee Materials Park, Ohio ASM International ©2004 1 Online-Ressource (xiv, 800 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and indexes Introduction -- - Failure analysis process flow -- - Failure verification -- - Failure mode: failure classifications -- - Special devices -- - Non-destructive analysis techniques -- - Depackaging -- - Photon emission (electroluminescence) localization techniques -- - Microthermography -- - Laser and particle beam-based localization techniques -- - Deprocessing -- - General imaging techniques -- - Local deprocessing and imaging -- - Materials analysis techniques -- - Important topics for semiconductor devices -- - FA techniques/tools roadmaps -- - FA operation and management -- - Appendix TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc Electronic Device Failure Analysis Society Desk Reference Committee Sonstige oth ASM International Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=395872 Aggregator Volltext |
| spellingShingle | Microelectronics failure analysis desk reference TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
| title | Microelectronics failure analysis desk reference |
| title_auth | Microelectronics failure analysis desk reference |
| title_exact_search | Microelectronics failure analysis desk reference |
| title_full | Microelectronics failure analysis desk reference edited by the Electronic Device Failure Analysis Society, Desk Reference Committee |
| title_fullStr | Microelectronics failure analysis desk reference edited by the Electronic Device Failure Analysis Society, Desk Reference Committee |
| title_full_unstemmed | Microelectronics failure analysis desk reference edited by the Electronic Device Failure Analysis Society, Desk Reference Committee |
| title_short | Microelectronics failure analysis |
| title_sort | microelectronics failure analysis desk reference |
| title_sub | desk reference |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Defects Testing Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Electronics Materials Defects Handbooks, manuals, etc |
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| work_keys_str_mv | AT electronicdevicefailureanalysissocietydeskreferencecommittee microelectronicsfailureanalysisdeskreference AT asminternational microelectronicsfailureanalysisdeskreference |