ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c2005
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xviii, 524 p.) |
| ISBN: | 087170823X 1615030883 9780871708236 9781615030880 |
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Datensatz im Suchindex
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| spelling | International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.> Verfasser aut ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International Materials Park, OH ASM International c2005 1 Online-Ressource (xviii, 524 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=395884 Aggregator Volltext |
| spellingShingle | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4014346-6 (DE-588)1071861417 |
| title | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_auth | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_exact_search | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_full | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_fullStr | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_full_unstemmed | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_short | ISTFA 2005 |
| title_sort | istfa 2005 proceedings of the 31st international symposium for testing and failure analysis movember 6 10 2005 mcenery convention center san jose california |
| title_sub | Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik Elektronik Konferenzschrift |
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