Advanced production testing of RF, SoC, and SiP devices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Artech House
c2007
|
| Schriftenreihe: | Artech House microwave library
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xx, 301 p.) |
| ISBN: | 158053709X 1580537103 9781580537094 9781580537100 |
Internformat
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| 245 | 1 | 0 | |a Advanced production testing of RF, SoC, and SiP devices |c Joe Kelly, Michael Engelhardt |
| 264 | 1 | |a Boston |b Artech House |c c2007 | |
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| 490 | 0 | |a Artech House microwave library | |
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Datensatz im Suchindex
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| author | Kelly, Joe, Ph. D. |
| author_facet | Kelly, Joe, Ph. D. |
| author_role | aut |
| author_sort | Kelly, Joe, Ph. D. |
| author_variant | j p d k jpd jpdk |
| building | Verbundindex |
| bvnumber | BV043064421 |
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| ctrlnum | (OCoLC)228292434 (DE-599)BVBBV043064421 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
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| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV043064421 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:16:21Z |
| institution | BVB |
| isbn | 158053709X 1580537103 9781580537094 9781580537100 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028488613 |
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| physical | 1 Online-Ressource (xx, 301 p.) |
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| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House microwave library |
| spelling | Kelly, Joe, Ph. D. Verfasser aut Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt Boston Artech House c2007 1 Online-Ressource (xx, 301 p.) txt rdacontent c rdamedia cr rdacarrier Artech House microwave library Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Systems on a chip Testing Engelhardt, M. Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=225173 Aggregator Volltext |
| spellingShingle | Kelly, Joe, Ph. D. Advanced production testing of RF, SoC, and SiP devices TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Systems on a chip Testing |
| title | Advanced production testing of RF, SoC, and SiP devices |
| title_auth | Advanced production testing of RF, SoC, and SiP devices |
| title_exact_search | Advanced production testing of RF, SoC, and SiP devices |
| title_full | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_fullStr | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_full_unstemmed | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_short | Advanced production testing of RF, SoC, and SiP devices |
| title_sort | advanced production testing of rf soc and sip devices |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Systems on a chip Testing |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Systems on a chip Testing |
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