Characterization and behavior of interfaces: proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA
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Bibliographic Details
Main Author: Frost, J. David (Author)
Format: Book
Language:English
Published: Amsterdam IOS Press 2010
Subjects:
Item Description:"The Georgia Institute of Technology hosted a one-day Research Symposium on Characterization and Behavior of Interfaces (CBI) that was held in conjunction with the Fourth International Symposium on Deformation Characteristics of Geomaterials (IS Atlanta 2008). The CBI research symposium was held on September 21, 2008."--P. vii.
Includes bibliographical references and indexes
Physical Description:X, 155 S. Ill. 25 cm
ISBN:9781607504900
1607504901

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