Characterization and behavior of interfaces: proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA
Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Frost, J. David (VerfasserIn)
Format: Buch
Sprache:English
Veröffentlicht: Amsterdam IOS Press 2010
Schlagworte:
Beschreibung:"The Georgia Institute of Technology hosted a one-day Research Symposium on Characterization and Behavior of Interfaces (CBI) that was held in conjunction with the Fourth International Symposium on Deformation Characteristics of Geomaterials (IS Atlanta 2008). The CBI research symposium was held on September 21, 2008."--P. vii.
Includes bibliographical references and indexes
Beschreibung:X, 155 S. Ill. 25 cm
ISBN:9781607504900
1607504901

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