Theory of CMOS Digital Circuits and Circuit Failures:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Princeton, N.J.
Princeton University Press
[1992]
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes.Originally published in 1992.The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905 |
| Beschreibung: | 1 Online-Ressource (596p.) |
| ISBN: | 9781400862849 |
| DOI: | 10.1515/9781400862849 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV042523994 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150423s1992 |||| o||u| ||||||eng d | ||
| 020 | |a 9781400862849 |9 978-1-4008-6284-9 | ||
| 024 | 7 | |a 10.1515/9781400862849 |2 doi | |
| 035 | |a (OCoLC)889252808 | ||
| 035 | |a (DE-599)BVBBV042523994 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.39/5 |2 23 | |
| 100 | 1 | |a Shoji, Masakazu |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Theory of CMOS Digital Circuits and Circuit Failures |c Masakazu Shoji |
| 264 | 1 | |a Princeton, N.J. |b Princeton University Press |c [1992] | |
| 300 | |a 1 Online-Ressource (596p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes.Originally published in 1992.The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905 | ||
| 546 | |a In English | ||
| 650 | 4 | |a Ingenieurwissenschaften und Maschinenbau | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary | |
| 650 | 4 | |a Semiconductors / Failures | |
| 650 | 4 | |a Digital integrated circuits / Design and construction / Data processing | |
| 650 | 7 | |a MATHEMATICS / Complex Analysis |2 bisacsh | |
| 650 | 4 | |a Datenverarbeitung | |
| 650 | 0 | 7 | |a Stromkreis |0 (DE-588)4183738-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CMOS |0 (DE-588)4010319-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Diagnosesystem |0 (DE-588)4149458-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Fehler |0 (DE-588)4016606-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |D s |
| 689 | 0 | 1 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |D s |
| 689 | 0 | 2 | |a Fehler |0 (DE-588)4016606-5 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a CMOS |0 (DE-588)4010319-5 |D s |
| 689 | 1 | 1 | |a Stromkreis |0 (DE-588)4183738-1 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 689 | 2 | 0 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |D s |
| 689 | 2 | 1 | |a Diagnosesystem |0 (DE-588)4149458-1 |D s |
| 689 | 2 | |8 3\p |5 DE-604 | |
| 856 | 4 | 0 | |u https://doi.org/10.1515/9781400862849 |x Verlag |3 Volltext |
| 912 | |a ZDB-23-DGG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027958333 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804153278400823296 |
|---|---|
| any_adam_object | |
| author | Shoji, Masakazu |
| author_facet | Shoji, Masakazu |
| author_role | aut |
| author_sort | Shoji, Masakazu |
| author_variant | m s ms |
| building | Verbundindex |
| bvnumber | BV042523994 |
| collection | ZDB-23-DGG |
| ctrlnum | (OCoLC)889252808 (DE-599)BVBBV042523994 |
| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5 |
| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1515/9781400862849 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04370nmm a2200613zc 4500</leader><controlfield tag="001">BV042523994</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150423s1992 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781400862849</subfield><subfield code="9">978-1-4008-6284-9</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1515/9781400862849</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)889252808</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042523994</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/5</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shoji, Masakazu</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Theory of CMOS Digital Circuits and Circuit Failures</subfield><subfield code="c">Masakazu Shoji</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Princeton, N.J.</subfield><subfield code="b">Princeton University Press</subfield><subfield code="c">[1992]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (596p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes.Originally published in 1992.The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">In English</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften und Maschinenbau</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Metal oxide semiconductors, Complementary</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors / Failures</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Digital integrated circuits / Design and construction / Data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">MATHEMATICS / Complex Analysis</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Datenverarbeitung</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Stromkreis</subfield><subfield code="0">(DE-588)4183738-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Digitale integrierte Schaltung</subfield><subfield code="0">(DE-588)4113313-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Diagnosesystem</subfield><subfield code="0">(DE-588)4149458-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehler</subfield><subfield code="0">(DE-588)4016606-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS-Schaltung</subfield><subfield code="0">(DE-588)4148111-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Digitale integrierte Schaltung</subfield><subfield code="0">(DE-588)4113313-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">CMOS-Schaltung</subfield><subfield code="0">(DE-588)4148111-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Fehler</subfield><subfield code="0">(DE-588)4016606-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Stromkreis</subfield><subfield code="0">(DE-588)4183738-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">CMOS-Schaltung</subfield><subfield code="0">(DE-588)4148111-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Diagnosesystem</subfield><subfield code="0">(DE-588)4149458-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1515/9781400862849</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-23-DGG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027958333</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV042523994 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:24:04Z |
| institution | BVB |
| isbn | 9781400862849 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027958333 |
| oclc_num | 889252808 |
| open_access_boolean | |
| physical | 1 Online-Ressource (596p.) |
| psigel | ZDB-23-DGG |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Princeton University Press |
| record_format | marc |
| spelling | Shoji, Masakazu Verfasser aut Theory of CMOS Digital Circuits and Circuit Failures Masakazu Shoji Princeton, N.J. Princeton University Press [1992] 1 Online-Ressource (596p.) txt rdacontent c rdamedia cr rdacarrier CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes.Originally published in 1992.The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905 In English Ingenieurwissenschaften und Maschinenbau Metal oxide semiconductors, Complementary Semiconductors / Failures Digital integrated circuits / Design and construction / Data processing MATHEMATICS / Complex Analysis bisacsh Datenverarbeitung Stromkreis (DE-588)4183738-1 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 gnd rswk-swf CMOS (DE-588)4010319-5 gnd rswk-swf Diagnosesystem (DE-588)4149458-1 gnd rswk-swf Fehler (DE-588)4016606-5 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 s CMOS-Schaltung (DE-588)4148111-2 s Fehler (DE-588)4016606-5 s 1\p DE-604 CMOS (DE-588)4010319-5 s Stromkreis (DE-588)4183738-1 s 2\p DE-604 Diagnosesystem (DE-588)4149458-1 s 3\p DE-604 https://doi.org/10.1515/9781400862849 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Shoji, Masakazu Theory of CMOS Digital Circuits and Circuit Failures Ingenieurwissenschaften und Maschinenbau Metal oxide semiconductors, Complementary Semiconductors / Failures Digital integrated circuits / Design and construction / Data processing MATHEMATICS / Complex Analysis bisacsh Datenverarbeitung Stromkreis (DE-588)4183738-1 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd CMOS (DE-588)4010319-5 gnd Diagnosesystem (DE-588)4149458-1 gnd Fehler (DE-588)4016606-5 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| subject_GND | (DE-588)4183738-1 (DE-588)4113313-4 (DE-588)4010319-5 (DE-588)4149458-1 (DE-588)4016606-5 (DE-588)4148111-2 |
| title | Theory of CMOS Digital Circuits and Circuit Failures |
| title_auth | Theory of CMOS Digital Circuits and Circuit Failures |
| title_exact_search | Theory of CMOS Digital Circuits and Circuit Failures |
| title_full | Theory of CMOS Digital Circuits and Circuit Failures Masakazu Shoji |
| title_fullStr | Theory of CMOS Digital Circuits and Circuit Failures Masakazu Shoji |
| title_full_unstemmed | Theory of CMOS Digital Circuits and Circuit Failures Masakazu Shoji |
| title_short | Theory of CMOS Digital Circuits and Circuit Failures |
| title_sort | theory of cmos digital circuits and circuit failures |
| topic | Ingenieurwissenschaften und Maschinenbau Metal oxide semiconductors, Complementary Semiconductors / Failures Digital integrated circuits / Design and construction / Data processing MATHEMATICS / Complex Analysis bisacsh Datenverarbeitung Stromkreis (DE-588)4183738-1 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd CMOS (DE-588)4010319-5 gnd Diagnosesystem (DE-588)4149458-1 gnd Fehler (DE-588)4016606-5 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| topic_facet | Ingenieurwissenschaften und Maschinenbau Metal oxide semiconductors, Complementary Semiconductors / Failures Digital integrated circuits / Design and construction / Data processing MATHEMATICS / Complex Analysis Datenverarbeitung Stromkreis Digitale integrierte Schaltung CMOS Diagnosesystem Fehler CMOS-Schaltung |
| url | https://doi.org/10.1515/9781400862849 |
| work_keys_str_mv | AT shojimasakazu theoryofcmosdigitalcircuitsandcircuitfailures |