Analytical Electron Microscopy for Materials Science:
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Tokyo
Springer Japan
2002
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation |
| Beschreibung: | 1 Online-Ressource (IX, 152 p) |
| ISBN: | 9784431669883 9784431703365 |
| DOI: | 10.1007/978-4-431-66988-3 |
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Datensatz im Suchindex
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| discipline | Physik |
| doi_str_mv | 10.1007/978-4-431-66988-3 |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:56Z |
| institution | BVB |
| isbn | 9784431669883 9784431703365 |
| language | English |
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| physical | 1 Online-Ressource (IX, 152 p) |
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| publishDate | 2002 |
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| publisher | Springer Japan |
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| spelling | Shindo, Daisuke Verfasser aut Analytical Electron Microscopy for Materials Science by Daisuke Shindo, Tetsuo Oikawa Tokyo Springer Japan 2002 1 Online-Ressource (IX, 152 p) txt rdacontent c rdamedia cr rdacarrier Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation Physics Condensed Matter Physics Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 1\p DE-604 Oikawa, Tetsuo Sonstige oth https://doi.org/10.1007/978-4-431-66988-3 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Shindo, Daisuke Analytical Electron Microscopy for Materials Science Physics Condensed Matter Physics Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4215608-7 |
| title | Analytical Electron Microscopy for Materials Science |
| title_auth | Analytical Electron Microscopy for Materials Science |
| title_exact_search | Analytical Electron Microscopy for Materials Science |
| title_full | Analytical Electron Microscopy for Materials Science by Daisuke Shindo, Tetsuo Oikawa |
| title_fullStr | Analytical Electron Microscopy for Materials Science by Daisuke Shindo, Tetsuo Oikawa |
| title_full_unstemmed | Analytical Electron Microscopy for Materials Science by Daisuke Shindo, Tetsuo Oikawa |
| title_short | Analytical Electron Microscopy for Materials Science |
| title_sort | analytical electron microscopy for materials science |
| topic | Physics Condensed Matter Physics Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | Physics Condensed Matter Physics Durchstrahlungselektronenmikroskopie |
| url | https://doi.org/10.1007/978-4-431-66988-3 |
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