Characterization of crystal growth defects by X-Ray methods: proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Elektronisch Tagungsbericht E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1980
|
| Schriftenreihe: | Nato Advanced Study Institutes Series, Series B. Physics
63 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies |
| Beschreibung: | 1 Online-Ressource (XXVI, 589 p) |
| ISBN: | 9781475711264 9781475711288 |
| DOI: | 10.1007/978-1-4757-1126-4 |
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| 500 | |a This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies | ||
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Datensatz im Suchindex
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| discipline | Physik |
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| spelling | Tanner, Brian K. 1947- (DE-588)1080064087 edt Characterization of crystal growth defects by X-Ray methods proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom edited by Brian K. Tanner and D. Keith Bowen Boston, MA Springer US 1980 1 Online-Ressource (XXVI, 589 p) txt rdacontent c rdamedia cr rdacarrier Nato Advanced Study Institutes Series, Series B. Physics 63 This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies Physics Physics, general Röntgenographie (DE-588)4178316-5 gnd rswk-swf Kristallwachstum (DE-588)4123579-4 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift 1979 Durham gnd-content Gitterbaufehler (DE-588)4125030-8 s Kristallwachstum (DE-588)4123579-4 s Röntgenographie (DE-588)4178316-5 s 2\p DE-604 Bowen, David Keith 1940- (DE-588)13163156X edt Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods 1979 Durham Sonstige (DE-588)801648-3 oth Erscheint auch als Druck-Ausgabe 0-306-40628-4 https://doi.org/10.1007/978-1-4757-1126-4 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Characterization of crystal growth defects by X-Ray methods proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom Physics Physics, general Röntgenographie (DE-588)4178316-5 gnd Kristallwachstum (DE-588)4123579-4 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4178316-5 (DE-588)4123579-4 (DE-588)4125030-8 (DE-588)1071861417 |
| title | Characterization of crystal growth defects by X-Ray methods proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom |
| title_auth | Characterization of crystal growth defects by X-Ray methods proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom |
| title_exact_search | Characterization of crystal growth defects by X-Ray methods proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom |
| title_full | Characterization of crystal growth defects by X-Ray methods proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom edited by Brian K. Tanner and D. Keith Bowen |
| title_fullStr | Characterization of crystal growth defects by X-Ray methods proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom edited by Brian K. Tanner and D. Keith Bowen |
| title_full_unstemmed | Characterization of crystal growth defects by X-Ray methods proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom edited by Brian K. Tanner and D. Keith Bowen |
| title_short | Characterization of crystal growth defects by X-Ray methods |
| title_sort | characterization of crystal growth defects by x ray methods proceedings of the nato advanced study institute on characterization of crystal growth defects by x ray models held august 29 september 10 1979 at durham university durham united kingdom |
| title_sub | proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom |
| topic | Physics Physics, general Röntgenographie (DE-588)4178316-5 gnd Kristallwachstum (DE-588)4123579-4 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Physics Physics, general Röntgenographie Kristallwachstum Gitterbaufehler Konferenzschrift 1979 Durham |
| url | https://doi.org/10.1007/978-1-4757-1126-4 |
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