APA (7th ed.) Citation

Tanner, B. K., & Bowen, D. K. (1980). Characterization of crystal growth defects by X-Ray methods: Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom. Springer US. https://doi.org/10.1007/978-1-4757-1126-4

Chicago Style (17th ed.) Citation

Tanner, Brian K., and David Keith Bowen. Characterization of Crystal Growth Defects by X-Ray Methods: Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, Held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom. Boston, MA: Springer US, 1980. https://doi.org/10.1007/978-1-4757-1126-4.

MLA (9th ed.) Citation

Tanner, Brian K., and David Keith Bowen. Characterization of Crystal Growth Defects by X-Ray Methods: Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Models, Held August 29 - September 10, 1979, at Durham University, Durham, United Kingdom. Springer US, 1980. https://doi.org/10.1007/978-1-4757-1126-4.