Optical characterization of semiconductors: infrared, Raman, and photoluminescence spectroscopy
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
London
Academic Press
©1993
|
| Schriftenreihe: | Techniques of physics
14 |
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references (pages 207-215) and index Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique Each method is illustrated with dozens of case studies taken from current literature, which address specific problems in silicon, GaAs, Al[subscript x]Ga[subscript 1-x]As, and other widely-used materials. This library of uses, arranged by property evaluated (such as impurity type, resistivity, and layer thickness) is valuable even for those familiar with optical methods Practical information is given to help establish optical facilities, including commercial sources for equipment, and experimental details which draw on the author's wide experience For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods for characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics or photonics, the book provides a unique overview, bringing together these valuable techniques in a coherent way for the first time |
| Beschreibung: | 1 Online-Ressource (x, 220 pages) |
| ISBN: | 0080984274 0125507704 9780080984278 9780125507707 |
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| 490 | 0 | |a Techniques of physics |v 14 | |
| 500 | |a Includes bibliographical references (pages 207-215) and index | ||
| 500 | |a Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors | ||
| 500 | |a There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering | ||
| 500 | |a Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique | ||
| 500 | |a Each method is illustrated with dozens of case studies taken from current literature, which address specific problems in silicon, GaAs, Al[subscript x]Ga[subscript 1-x]As, and other widely-used materials. This library of uses, arranged by property evaluated (such as impurity type, resistivity, and layer thickness) is valuable even for those familiar with optical methods | ||
| 500 | |a Practical information is given to help establish optical facilities, including commercial sources for equipment, and experimental details which draw on the author's wide experience | ||
| 500 | |a For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods for characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics or photonics, the book provides a unique overview, bringing together these valuable techniques in a coherent way for the first time | ||
| 650 | 4 | |a Semiconductors / Optical properties | |
| 650 | 7 | |a Semiconductors / Testing / Optical methods |2 fast | |
| 650 | 7 | |a Spectroscopie infrarouge |2 ram | |
| 650 | 7 | |a Spectroscopie Raman |2 ram | |
| 650 | 7 | |a Photoluminescence |2 ram | |
| 650 | 7 | |a Semiconducteurs / Propriétés optiques |2 ram | |
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| 650 | 7 | |a Spektroskopie |2 swd | |
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Datensatz im Suchindex
| _version_ | 1804152900024270848 |
|---|---|
| any_adam_object | |
| author | Perkowitz, S. |
| author_facet | Perkowitz, S. |
| author_role | aut |
| author_sort | Perkowitz, S. |
| author_variant | s p sp |
| building | Verbundindex |
| bvnumber | BV042310848 |
| collection | ZDB-33-ESD |
| ctrlnum | (OCoLC)747304502 (DE-599)BVBBV042310848 |
| dewey-full | 621.3815/2/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2/0287 |
| dewey-search | 621.3815/2/0287 |
| dewey-sort | 3621.3815 12 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV042310848 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:18:03Z |
| institution | BVB |
| isbn | 0080984274 0125507704 9780080984278 9780125507707 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027747840 |
| oclc_num | 747304502 |
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| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | 1 Online-Ressource (x, 220 pages) |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 1993 |
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| publisher | Academic Press |
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| series2 | Techniques of physics |
| spelling | Perkowitz, S. Verfasser aut Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz London Academic Press ©1993 1 Online-Ressource (x, 220 pages) txt rdacontent c rdamedia cr rdacarrier Techniques of physics 14 Includes bibliographical references (pages 207-215) and index Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique Each method is illustrated with dozens of case studies taken from current literature, which address specific problems in silicon, GaAs, Al[subscript x]Ga[subscript 1-x]As, and other widely-used materials. This library of uses, arranged by property evaluated (such as impurity type, resistivity, and layer thickness) is valuable even for those familiar with optical methods Practical information is given to help establish optical facilities, including commercial sources for equipment, and experimental details which draw on the author's wide experience For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods for characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics or photonics, the book provides a unique overview, bringing together these valuable techniques in a coherent way for the first time Semiconductors / Optical properties Semiconductors / Testing / Optical methods fast Spectroscopie infrarouge ram Spectroscopie Raman ram Photoluminescence ram Semiconducteurs / Propriétés optiques ram Halbleiter swd Spektroskopie swd TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Semiconductors Testing Optical methods Halbleiter (DE-588)4022993-2 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Spektroskopie (DE-588)4056138-0 s 1\p DE-604 http://www.sciencedirect.com/science/book/9780125507707 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Perkowitz, S. Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Semiconductors / Optical properties Semiconductors / Testing / Optical methods fast Spectroscopie infrarouge ram Spectroscopie Raman ram Photoluminescence ram Semiconducteurs / Propriétés optiques ram Halbleiter swd Spektroskopie swd TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Semiconductors Testing Optical methods Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4056138-0 |
| title | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_auth | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_exact_search | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy |
| title_full | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_fullStr | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_full_unstemmed | Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy Sidney Perkowitz |
| title_short | Optical characterization of semiconductors |
| title_sort | optical characterization of semiconductors infrared raman and photoluminescence spectroscopy |
| title_sub | infrared, Raman, and photoluminescence spectroscopy |
| topic | Semiconductors / Optical properties Semiconductors / Testing / Optical methods fast Spectroscopie infrarouge ram Spectroscopie Raman ram Photoluminescence ram Semiconducteurs / Propriétés optiques ram Halbleiter swd Spektroskopie swd TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh Semiconductors Testing Optical methods Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| topic_facet | Semiconductors / Optical properties Semiconductors / Testing / Optical methods Spectroscopie infrarouge Spectroscopie Raman Photoluminescence Semiconducteurs / Propriétés optiques Halbleiter Spektroskopie TECHNOLOGY & ENGINEERING / Electronics / Semiconductors TECHNOLOGY & ENGINEERING / Electronics / Solid State Semiconductors Testing Optical methods |
| url | http://www.sciencedirect.com/science/book/9780125507707 |
| work_keys_str_mv | AT perkowitzs opticalcharacterizationofsemiconductorsinfraredramanandphotoluminescencespectroscopy |