Materials analysis by ion channeling: submicron crystallography
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Academic Press
1982
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| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Beschreibung: | Includes bibliographical references (p. 235-295) and index Our intention has been to write a book that would be useful to people with a variety of levels of interest in this subject. Clearly it should be useful to both graduate students and workers in the field. We have attempted to bring together many of the concepts used in channeling beam analysis with an indication of the origin of the ideas within fundamental channeling theory. The level of the book is appropriate to senior under-graduates and graduate students who have had a modern physics course work in related areas of materials science and wish to learn more about the "channeling" probe, its strengths, weaknesses, and areas of further potential application. To them we hope we have explained this apparent paradox of using mega-electron volt ions to probe solid state phenomena that have characteristic energies of electron volts |
| Beschreibung: | 1 Online-Ressource (xix, 300 p.) |
| ISBN: | 0122526805 0323139817 9780122526800 9780323139816 |
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| 245 | 1 | 0 | |a Materials analysis by ion channeling |b submicron crystallography |c Leonard C. Feldman, James W. Mayer, S. Thomas Picraux |
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| 500 | |a Our intention has been to write a book that would be useful to people with a variety of levels of interest in this subject. Clearly it should be useful to both graduate students and workers in the field. We have attempted to bring together many of the concepts used in channeling beam analysis with an indication of the origin of the ideas within fundamental channeling theory. The level of the book is appropriate to senior under-graduates and graduate students who have had a modern physics course work in related areas of materials science and wish to learn more about the "channeling" probe, its strengths, weaknesses, and areas of further potential application. To them we hope we have explained this apparent paradox of using mega-electron volt ions to probe solid state phenomena that have characteristic energies of electron volts | ||
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| 650 | 7 | |a Ion bombardment |2 fast | |
| 650 | 7 | |a Solids / Surfaces |2 fast | |
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Datensatz im Suchindex
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| author | Feldman, Leonard C. |
| author_facet | Feldman, Leonard C. |
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| author_sort | Feldman, Leonard C. |
| author_variant | l c f lc lcf |
| building | Verbundindex |
| bvnumber | BV042310732 |
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| ctrlnum | (OCoLC)565376126 (DE-599)BVBBV042310732 |
| dewey-full | 530.4/1 620.1/1299 |
| dewey-hundreds | 500 - Natural sciences and mathematics 600 - Technology (Applied sciences) |
| dewey-ones | 530 - Physics 620 - Engineering and allied operations |
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| dewey-sort | 3530.4 11 |
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| discipline | Physik |
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| id | DE-604.BV042310732 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:18:03Z |
| institution | BVB |
| isbn | 0122526805 0323139817 9780122526800 9780323139816 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027747724 |
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| physical | 1 Online-Ressource (xix, 300 p.) |
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| publishDate | 1982 |
| publishDateSearch | 1982 |
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| publisher | Academic Press |
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| spelling | Feldman, Leonard C. Verfasser aut Materials analysis by ion channeling submicron crystallography Leonard C. Feldman, James W. Mayer, S. Thomas Picraux New York Academic Press 1982 1 Online-Ressource (xix, 300 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (p. 235-295) and index Our intention has been to write a book that would be useful to people with a variety of levels of interest in this subject. Clearly it should be useful to both graduate students and workers in the field. We have attempted to bring together many of the concepts used in channeling beam analysis with an indication of the origin of the ideas within fundamental channeling theory. The level of the book is appropriate to senior under-graduates and graduate students who have had a modern physics course work in related areas of materials science and wish to learn more about the "channeling" probe, its strengths, weaknesses, and areas of further potential application. To them we hope we have explained this apparent paradox of using mega-electron volt ions to probe solid state phenomena that have characteristic energies of electron volts Channeling (Physics) fast Crystallography fast Crystals / Defects fast Ion bombardment fast Solids / Surfaces fast Channeling swd Ionenstrahl swd Kristallographie swd Sekundärionen-Massenspektrometrie swd Tunneleffekt swd SCIENCE / Nanoscience bisacsh Channeling (Physics) Solids Surfaces Crystals Defects Ion bombardment Crystallography Channeling (DE-588)4147560-4 gnd rswk-swf Kristallographie (DE-588)4033217-2 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Ionenstrahl (DE-588)4162347-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Kristallographie (DE-588)4033217-2 s Ionenstrahl (DE-588)4162347-2 s Tunneleffekt (DE-588)4136216-0 s 1\p DE-604 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s Channeling (DE-588)4147560-4 s 2\p DE-604 Mayer, James W. Sonstige oth Picraux, S. T. Sonstige oth http://www.sciencedirect.com/science/book/9780122526800 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Feldman, Leonard C. Materials analysis by ion channeling submicron crystallography Channeling (Physics) fast Crystallography fast Crystals / Defects fast Ion bombardment fast Solids / Surfaces fast Channeling swd Ionenstrahl swd Kristallographie swd Sekundärionen-Massenspektrometrie swd Tunneleffekt swd SCIENCE / Nanoscience bisacsh Channeling (Physics) Solids Surfaces Crystals Defects Ion bombardment Crystallography Channeling (DE-588)4147560-4 gnd Kristallographie (DE-588)4033217-2 gnd Tunneleffekt (DE-588)4136216-0 gnd Ionenstrahl (DE-588)4162347-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4147560-4 (DE-588)4033217-2 (DE-588)4136216-0 (DE-588)4162347-2 (DE-588)4077346-2 |
| title | Materials analysis by ion channeling submicron crystallography |
| title_auth | Materials analysis by ion channeling submicron crystallography |
| title_exact_search | Materials analysis by ion channeling submicron crystallography |
| title_full | Materials analysis by ion channeling submicron crystallography Leonard C. Feldman, James W. Mayer, S. Thomas Picraux |
| title_fullStr | Materials analysis by ion channeling submicron crystallography Leonard C. Feldman, James W. Mayer, S. Thomas Picraux |
| title_full_unstemmed | Materials analysis by ion channeling submicron crystallography Leonard C. Feldman, James W. Mayer, S. Thomas Picraux |
| title_short | Materials analysis by ion channeling |
| title_sort | materials analysis by ion channeling submicron crystallography |
| title_sub | submicron crystallography |
| topic | Channeling (Physics) fast Crystallography fast Crystals / Defects fast Ion bombardment fast Solids / Surfaces fast Channeling swd Ionenstrahl swd Kristallographie swd Sekundärionen-Massenspektrometrie swd Tunneleffekt swd SCIENCE / Nanoscience bisacsh Channeling (Physics) Solids Surfaces Crystals Defects Ion bombardment Crystallography Channeling (DE-588)4147560-4 gnd Kristallographie (DE-588)4033217-2 gnd Tunneleffekt (DE-588)4136216-0 gnd Ionenstrahl (DE-588)4162347-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Channeling (Physics) Crystallography Crystals / Defects Ion bombardment Solids / Surfaces Channeling Ionenstrahl Kristallographie Sekundärionen-Massenspektrometrie Tunneleffekt SCIENCE / Nanoscience Solids Surfaces Crystals Defects |
| url | http://www.sciencedirect.com/science/book/9780122526800 |
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