Applications of random process excursion analysis:
Saved in:
Bibliographic Details
Main Author: Brainina, Irina S. (Author)
Format: Electronic eBook
Language:English
Published: [Place of publication not identified] Elsevier Science & Technology 2013
Series:Elsevier insights
Subjects:
Online Access:Volltext
Item Description:This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics. Introduces English-speaking students and researchers in to the results obtained in the former Soviet/ Russian academic institutions within last few decades. Supplies a range of applications suitable for all levels from undergraduate to professional. Contains computer simulations
Includes bibliographical references
Physical Description:1 Online-Ressource (252 pages) Diagramme
ISBN:1299733689
9781299733688
9780124104693
012410469X
9780124095014
0124095011

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Get full text