Atomic force microscopy in process engineering: introduction to AFM for improved processes and products
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Oxford
Butterworth-Heinemann
©2009
|
| Edition: | 1st ed |
| Series: | Butterworth-Heinemann/IChemE series
|
| Subjects: | |
| Online Access: | Volltext |
| Item Description: | Includes bibliographical references and index Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to practising engineers, those who are improving their AFM skills and knowledge, and researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject |
| Physical Description: | 1 Online-Ressource (xvi, 283 pages) |
| ISBN: | 9780080949574 0080949576 |
Staff View
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 660 - Chemical engineering |
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| discipline | Chemie / Pharmazie |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:17:51Z |
| institution | BVB |
| isbn | 9780080949574 0080949576 |
| language | English |
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| physical | 1 Online-Ressource (xvi, 283 pages) |
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| publishDate | 2009 |
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| series2 | Butterworth-Heinemann/IChemE series |
| spelling | Atomic force microscopy in process engineering introduction to AFM for improved processes and products [edited by] W. Richard Bowen and Nidal Hilal 1st ed Oxford Butterworth-Heinemann ©2009 1 Online-Ressource (xvi, 283 pages) txt rdacontent c rdamedia cr rdacarrier Butterworth-Heinemann/IChemE series Includes bibliographical references and index Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to practising engineers, those who are improving their AFM skills and knowledge, and researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Atomic force microscopy fast Production engineering fast Atomic force microscopy Production engineering Bowen, W. Richard Sonstige oth Hilal, Nidal Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 978-1-85617-517-3 Erscheint auch als Druck-Ausgabe, Hardcover 1-85617-517-0 http://www.sciencedirect.com/science/book/9781856175173 Verlag Volltext |
| spellingShingle | Atomic force microscopy in process engineering introduction to AFM for improved processes and products TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Atomic force microscopy fast Production engineering fast Atomic force microscopy Production engineering |
| title | Atomic force microscopy in process engineering introduction to AFM for improved processes and products |
| title_auth | Atomic force microscopy in process engineering introduction to AFM for improved processes and products |
| title_exact_search | Atomic force microscopy in process engineering introduction to AFM for improved processes and products |
| title_full | Atomic force microscopy in process engineering introduction to AFM for improved processes and products [edited by] W. Richard Bowen and Nidal Hilal |
| title_fullStr | Atomic force microscopy in process engineering introduction to AFM for improved processes and products [edited by] W. Richard Bowen and Nidal Hilal |
| title_full_unstemmed | Atomic force microscopy in process engineering introduction to AFM for improved processes and products [edited by] W. Richard Bowen and Nidal Hilal |
| title_short | Atomic force microscopy in process engineering |
| title_sort | atomic force microscopy in process engineering introduction to afm for improved processes and products |
| title_sub | introduction to AFM for improved processes and products |
| topic | TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. bisacsh Atomic force microscopy fast Production engineering fast Atomic force microscopy Production engineering |
| topic_facet | TECHNOLOGY & ENGINEERING / Nanotechnology & MEMS. Atomic force microscopy Production engineering |
| url | http://www.sciencedirect.com/science/book/9781856175173 |
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