Verfügbarkeit: Hot carrier degradation in semiconductor devices

Hot carrier degradation in semiconductor devices:

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Bibliographische Detailangaben
Weitere Verfasser:	Grasser, Tibor 1970- (HerausgeberIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Cham [u.a.] Springer 2015
Schlagworte:	Ingenieurwissenschaften Electronics Systems engineering Engineering
Online-Zugang:	BHS01 BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FRO01 FWS01 FWS02 UBY01 Volltext
Beschreibung:	1 Online-Ressource
ISBN:	9783319089942
DOI:	10.1007/978-3-319-08994-2

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MARC


LEADER	00000nmm a2200000 c 4500
001	BV042241553
003	DE-604
005	00000000000000.0
007	cr\|uuu---uuuuu
008	141216s2015 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 9783319089942 \|c Online \|9 978-3-319-08994-2
024	7		\|a 10.1007/978-3-319-08994-2 \|2 doi
035			\|a (OCoLC)894720730
035			\|a (DE-599)BSZ41708451X
040			\|a DE-604 \|b ger
041	0		\|a eng
049			\|a DE-634 \|a DE-Aug4 \|a DE-1043 \|a DE-1046 \|a DE-859 \|a DE-92 \|a DE-898 \|a DE-863 \|a DE-862 \|a DE-573 \|a DE-B768 \|a DE-861 \|a DE-706
050		0	\|a TK7888.4
082	0		\|a 621.3815
245	1	0	\|a Hot carrier degradation in semiconductor devices \|c Tibor Grasser, ed.
264		1	\|a Cham [u.a.] \|b Springer \|c 2015
300			\|a 1 Online-Ressource
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
650		4	\|a Ingenieurwissenschaften
650		4	\|a Electronics
650		4	\|a Systems engineering
650		4	\|a Engineering
700	1		\|a Grasser, Tibor \|d 1970- \|0 (DE-588)136012345 \|4 edt
776	0	8	\|i Erscheint auch als \|n Druckausgabe \|z 978-3-319-08993-5
856	4	0	\|u https://doi.org/10.1007/978-3-319-08994-2 \|x Verlag \|3 Volltext
912			\|a ZDB-2-ENG
999			\|a oai:aleph.bib-bvb.de:BVB01-027679672
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l BHS01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l BTU01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FAB01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FAW01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FHA01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FHI01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FHN01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FHR01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FKE01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FRO01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FWS01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l FWS02 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-08994-2 \|l UBY01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext

Datensatz im Suchindex

DE-BY-FWS_katkey	541485
_version_	1806179182694105088
any_adam_object
author2	Grasser, Tibor 1970-
author2_role	edt
author2_variant	t g tg
author_GND	(DE-588)136012345
author_facet	Grasser, Tibor 1970-
building	Verbundindex
bvnumber	BV042241553
callnumber-first	T - Technology
callnumber-label	TK7888
callnumber-raw	TK7888.4
callnumber-search	TK7888.4
callnumber-sort	TK 47888.4
callnumber-subject	TK - Electrical and Nuclear Engineering
collection	ZDB-2-ENG
ctrlnum	(OCoLC)894720730 (DE-599)BSZ41708451X
dewey-full	621.3815
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3815
dewey-search	621.3815
dewey-sort	3621.3815
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
doi_str_mv	10.1007/978-3-319-08994-2
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02466nmm a2200529 c 4500</leader><controlfield tag="001">BV042241553</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">141216s2015 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319089942</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-319-08994-2</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-319-08994-2</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)894720730</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BSZ41708451X</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-B768</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7888.4</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Hot carrier degradation in semiconductor devices</subfield><subfield code="c">Tibor Grasser, ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Grasser, Tibor</subfield><subfield code="d">1970-</subfield><subfield code="0">(DE-588)136012345</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-3-319-08993-5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027679672</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">BHS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FAB01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-08994-2</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id	DE-604.BV042241553
illustrated	Not Illustrated
indexdate	2024-08-01T12:04:56Z
institution	BVB
isbn	9783319089942
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-027679672
oclc_num	894720730
open_access_boolean
owner	DE-634 DE-Aug4 DE-1043 DE-1046 DE-859 DE-92 DE-898 DE-BY-UBR DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-573 DE-B768 DE-861 DE-706
owner_facet	DE-634 DE-Aug4 DE-1043 DE-1046 DE-859 DE-92 DE-898 DE-BY-UBR DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-573 DE-B768 DE-861 DE-706
physical	1 Online-Ressource
psigel	ZDB-2-ENG
publishDate	2015
publishDateSearch	2015
publishDateSort	2015
publisher	Springer
record_format	marc
spellingShingle	Hot carrier degradation in semiconductor devices Ingenieurwissenschaften Electronics Systems engineering Engineering
title	Hot carrier degradation in semiconductor devices
title_auth	Hot carrier degradation in semiconductor devices
title_exact_search	Hot carrier degradation in semiconductor devices
title_full	Hot carrier degradation in semiconductor devices Tibor Grasser, ed.
title_fullStr	Hot carrier degradation in semiconductor devices Tibor Grasser, ed.
title_full_unstemmed	Hot carrier degradation in semiconductor devices Tibor Grasser, ed.
title_short	Hot carrier degradation in semiconductor devices
title_sort	hot carrier degradation in semiconductor devices
topic	Ingenieurwissenschaften Electronics Systems engineering Engineering
topic_facet	Ingenieurwissenschaften Electronics Systems engineering Engineering
url	https://doi.org/10.1007/978-3-319-08994-2
work_keys_str_mv	AT grassertibor hotcarrierdegradationinsemiconductordevices

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