Circuit design for reliability:
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Bibliographic Details
Other Authors: Reis, Ricardo (Editor)
Format: Electronic eBook
Language:English
Published: New York, NY [u.a.] Springer 2015
Subjects:
Online Access:TUM01
Volltext
ISBN:9781461440789
9781461440772
DOI:10.1007/978-1-4614-4078-9