New approaches to image processing based failure analysis of nano-scale ULSI devices:
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Bibliographic Details
Main Author: Zalevsky, Zeev (Author)
Format: Book
Language:English
Published: Oxford, UK William Andrew 2014
Series:Micro & nano technologies series
Subjects:
Online Access:http://site.ebrary.com/lib/alltitles/docDetail.action?docID=10812561
Inhaltsverzeichnis
Item Description:Includes bibliographical references
Physical Description:101 S. Ill, graph. Darst.
ISBN:9780323241434

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