APA (7th ed.) Citation

Zalevsky, Z. (2014). New approaches to image processing based failure analysis of nano-scale ULSI devices. William Andrew.

Chicago Style (17th ed.) Citation

Zalevsky, Zeev. New Approaches to Image Processing Based Failure Analysis of Nano-scale ULSI Devices. Oxford, UK: William Andrew, 2014.

MLA (9th ed.) Citation

Zalevsky, Zeev. New Approaches to Image Processing Based Failure Analysis of Nano-scale ULSI Devices. William Andrew, 2014.