APA-Zitierstil (7. Ausg.)

Zalevsky, Z. (2014). New approaches to image processing based failure analysis of nano-scale ULSI devices. William Andrew.

Chicago-Zitierstil (17. Ausg.)

Zalevsky, Zeev. New Approaches to Image Processing Based Failure Analysis of Nano-scale ULSI Devices. Oxford, UK: William Andrew, 2014.

MLA-Zitierstil (9. Ausg.)

Zalevsky, Zeev. New Approaches to Image Processing Based Failure Analysis of Nano-scale ULSI Devices. William Andrew, 2014.