Fringe pattern analysis for optical metrology: theory, algorithms, and applications
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Bibliographic Details
Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Author), Padilla, Moisés José (Author)
Format: Book
Language:English
Published: Weinheim Wiley-VCH 2014
Subjects:
Online Access:Inhaltstext
Inhaltsverzeichnis
Physical Description:XVI, 327 S. Ill., graph. Darst.
ISBN:3527411526
9783527411528
9783527681075

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