APA (7th ed.) Citation

Servín, M., Quiroga, J. A., & Padilla, M. J. (2014). Fringe pattern analysis for optical metrology: Theory, algorithms, and applications. Wiley-VCH.

Chicago Style (17th ed.) Citation

Servín, Manuel, J. Antonio Quiroga, and Moisés José Padilla. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. Weinheim: Wiley-VCH, 2014.

MLA (9th ed.) Citation

Servín, Manuel, et al. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. Wiley-VCH, 2014.