Reliability of microtechnology: interconnects, devices, and systems
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
New York
Springer
c2011
|
| Subjects: | |
| Online Access: | Volltext |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | 1 Online-Ressource (xiii, 204 p.) |
| ISBN: | 9781441957597 1441957596 9781283083461 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV041905361 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 140612s2011 |||| o||u| ||||||eng d | ||
| 020 | |a 9781441957597 |c hdbk. : acidfree paper |9 978-1-4419-5759-7 | ||
| 020 | |a 1441957596 |c hdbk. : acidfree paper |9 1-4419-5759-6 | ||
| 020 | |a 9781283083461 |c MyiLibrary |9 978-1-283-08346-1 | ||
| 035 | |a (OCoLC)741449965 | ||
| 035 | |a (DE-599)BVBBV041905361 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.381 |2 22 | |
| 245 | 1 | 0 | |a Reliability of microtechnology |b interconnects, devices, and systems |c Johan Liu ... [et al.] |
| 264 | 1 | |a New York |b Springer |c c2011 | |
| 300 | |a 1 Online-Ressource (xiii, 204 p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Microtechnology | |
| 650 | 4 | |a Microtechnology / Reliability | |
| 650 | 4 | |a Microelectromechanical systems | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 0 | 7 | |a Mikrosystemtechnik |0 (DE-588)4221617-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Mikrosystemtechnik |0 (DE-588)4221617-5 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Liu, Johan |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://lib.myilibrary.com?id=308346 |x Aggregator |3 Volltext |
| 912 | |a ZDB-26-MYL | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027349031 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804152263558561792 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV041905361 |
| collection | ZDB-26-MYL |
| ctrlnum | (OCoLC)741449965 (DE-599)BVBBV041905361 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01599nmm a2200433zc 4500</leader><controlfield tag="001">BV041905361</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">140612s2011 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781441957597</subfield><subfield code="c">hdbk. : acidfree paper</subfield><subfield code="9">978-1-4419-5759-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1441957596</subfield><subfield code="c">hdbk. : acidfree paper</subfield><subfield code="9">1-4419-5759-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781283083461</subfield><subfield code="c">MyiLibrary</subfield><subfield code="9">978-1-283-08346-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)741449965</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV041905361</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability of microtechnology</subfield><subfield code="b">interconnects, devices, and systems</subfield><subfield code="c">Johan Liu ... [et al.]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Springer</subfield><subfield code="c">c2011</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xiii, 204 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microtechnology</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microtechnology / Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectromechanical systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanotechnology</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikrosystemtechnik</subfield><subfield code="0">(DE-588)4221617-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikrosystemtechnik</subfield><subfield code="0">(DE-588)4221617-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liu, Johan</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://lib.myilibrary.com?id=308346</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-26-MYL</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027349031</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV041905361 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:07:56Z |
| institution | BVB |
| isbn | 9781441957597 1441957596 9781283083461 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027349031 |
| oclc_num | 741449965 |
| open_access_boolean | |
| physical | 1 Online-Ressource (xiii, 204 p.) |
| psigel | ZDB-26-MYL |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Springer |
| record_format | marc |
| spelling | Reliability of microtechnology interconnects, devices, and systems Johan Liu ... [et al.] New York Springer c2011 1 Online-Ressource (xiii, 204 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Microtechnology Microtechnology / Reliability Microelectromechanical systems Nanotechnology Mikrosystemtechnik (DE-588)4221617-5 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Mikrosystemtechnik (DE-588)4221617-5 s Zuverlässigkeit (DE-588)4059245-5 s 1\p DE-604 Liu, Johan Sonstige oth http://lib.myilibrary.com?id=308346 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Reliability of microtechnology interconnects, devices, and systems Microtechnology Microtechnology / Reliability Microelectromechanical systems Nanotechnology Mikrosystemtechnik (DE-588)4221617-5 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4221617-5 (DE-588)4059245-5 |
| title | Reliability of microtechnology interconnects, devices, and systems |
| title_auth | Reliability of microtechnology interconnects, devices, and systems |
| title_exact_search | Reliability of microtechnology interconnects, devices, and systems |
| title_full | Reliability of microtechnology interconnects, devices, and systems Johan Liu ... [et al.] |
| title_fullStr | Reliability of microtechnology interconnects, devices, and systems Johan Liu ... [et al.] |
| title_full_unstemmed | Reliability of microtechnology interconnects, devices, and systems Johan Liu ... [et al.] |
| title_short | Reliability of microtechnology |
| title_sort | reliability of microtechnology interconnects devices and systems |
| title_sub | interconnects, devices, and systems |
| topic | Microtechnology Microtechnology / Reliability Microelectromechanical systems Nanotechnology Mikrosystemtechnik (DE-588)4221617-5 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Microtechnology Microtechnology / Reliability Microelectromechanical systems Nanotechnology Mikrosystemtechnik Zuverlässigkeit |
| url | http://lib.myilibrary.com?id=308346 |
| work_keys_str_mv | AT liujohan reliabilityofmicrotechnologyinterconnectsdevicesandsystems |