Atomic force microscopy: understanding basic modes and advanced applications
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Hoboken, N.J.
John Wiley & Sons
c2012
|
| Subjects: | |
| Online Access: | Volltext |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | 1 Online-Ressource (xxii, 464 p.) |
| ISBN: | 9780470638828 9781283646024 |
Staff View
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| isbn | 9780470638828 9781283646024 |
| language | English |
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| spelling | Haugstad, Greg Verfasser aut Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad Hoboken, N.J. John Wiley & Sons c2012 1 Online-Ressource (xxii, 464 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s 1\p DE-604 http://lib.myilibrary.com?id=395852 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Haugstad, Greg Atomic force microscopy understanding basic modes and advanced applications Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 |
| title | Atomic force microscopy understanding basic modes and advanced applications |
| title_auth | Atomic force microscopy understanding basic modes and advanced applications |
| title_exact_search | Atomic force microscopy understanding basic modes and advanced applications |
| title_full | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_fullStr | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_full_unstemmed | Atomic force microscopy understanding basic modes and advanced applications Greg Haugstad |
| title_short | Atomic force microscopy |
| title_sort | atomic force microscopy understanding basic modes and advanced applications |
| title_sub | understanding basic modes and advanced applications |
| topic | Atomic force microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Atomic force microscopy Rasterkraftmikroskopie |
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