APA (7th ed.) Citation

Haugstad, G. (2012). Atomic force microscopy: Understanding basic modes and advanced applications. John Wiley & Sons.

Chicago Style (17th ed.) Citation

Haugstad, Greg. Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications. Hoboken, N.J: John Wiley & Sons, 2012.

MLA (9th ed.) Citation

Haugstad, Greg. Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications. John Wiley & Sons, 2012.

Warning: These citations may not always be 100% accurate.