Scanning probe microscopy in industrial applications: nanomechanical characterization
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| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Hoboken, NJ
Wiley
2014
|
| Subjects: | |
| Online Access: | FRO01 UBT01 Volltext |
| Item Description: | Online-Ausg. 2013 erschienen. - Angekündigt u.d.T.: Scanning probe microscopy for industrial applications |
| Physical Description: | 1 Online-Ressource |
| ISBN: | 9781118723111 |
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| 505 | 0 | |a Overview of Atomic Force Microscopy / Dalia G Yablon -- Understanding the Tip-Sample Contact / Tevis D B Jacobs, C Mathew Mate, Kevin T Turner, Robert W Carpick -- Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves / Sudharsan Balasubramaniam, Daniel Kiracofe, Arvind Raman -- Phase Imaging / Dalia G Yablon, Greg Haugstad -- Dynamic Contact AFM Methods for Nanomechanical Properties / Donna C Hurley, Jason P Killgore -- Guide to Best Practices for AFM Users / Greg Haugstad -- Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution / Steve J Bull -- Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry / Foucher Johann -- Atomic Force Microscopy of Polymers / Andy H Tsou, Dalia G Yablon -- Unraveling Links between Food Structure and Function with Probe Microscopy / A Patrick Gunning, Victor J Morris -- Microcantilever Sensors for Petrochemical Applications / Alan M Schilowitz -- Applications of Scanning Probe Methods in Cosmetic Science / Gustavo S Luengo, Anthony Galliano -- Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development / Matthew S Lamm -- Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials / Katharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, Kumar Virwani -- Nanomechanical Characterization of Biomaterial Surfaces / Klaus Wormuth, Greg Haugstad | |
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Record in the Search Index
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| contents | Overview of Atomic Force Microscopy / Dalia G Yablon -- Understanding the Tip-Sample Contact / Tevis D B Jacobs, C Mathew Mate, Kevin T Turner, Robert W Carpick -- Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves / Sudharsan Balasubramaniam, Daniel Kiracofe, Arvind Raman -- Phase Imaging / Dalia G Yablon, Greg Haugstad -- Dynamic Contact AFM Methods for Nanomechanical Properties / Donna C Hurley, Jason P Killgore -- Guide to Best Practices for AFM Users / Greg Haugstad -- Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution / Steve J Bull -- Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry / Foucher Johann -- Atomic Force Microscopy of Polymers / Andy H Tsou, Dalia G Yablon -- Unraveling Links between Food Structure and Function with Probe Microscopy / A Patrick Gunning, Victor J Morris -- Microcantilever Sensors for Petrochemical Applications / Alan M Schilowitz -- Applications of Scanning Probe Methods in Cosmetic Science / Gustavo S Luengo, Anthony Galliano -- Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development / Matthew S Lamm -- Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials / Katharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, Kumar Virwani -- Nanomechanical Characterization of Biomaterial Surfaces / Klaus Wormuth, Greg Haugstad |
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| dewey-sort | 3502.8 12 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Chemie / Pharmazie Allgemeine Naturwissenschaft Physik |
| format | Electronic eBook |
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| isbn | 9781118723111 |
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| spelling | Scanning probe microscopy in industrial applications nanomechanical characterization edited by Dalia G. Yablon Hoboken, NJ Wiley 2014 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Online-Ausg. 2013 erschienen. - Angekündigt u.d.T.: Scanning probe microscopy for industrial applications Overview of Atomic Force Microscopy / Dalia G Yablon -- Understanding the Tip-Sample Contact / Tevis D B Jacobs, C Mathew Mate, Kevin T Turner, Robert W Carpick -- Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves / Sudharsan Balasubramaniam, Daniel Kiracofe, Arvind Raman -- Phase Imaging / Dalia G Yablon, Greg Haugstad -- Dynamic Contact AFM Methods for Nanomechanical Properties / Donna C Hurley, Jason P Killgore -- Guide to Best Practices for AFM Users / Greg Haugstad -- Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution / Steve J Bull -- Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry / Foucher Johann -- Atomic Force Microscopy of Polymers / Andy H Tsou, Dalia G Yablon -- Unraveling Links between Food Structure and Function with Probe Microscopy / A Patrick Gunning, Victor J Morris -- Microcantilever Sensors for Petrochemical Applications / Alan M Schilowitz -- Applications of Scanning Probe Methods in Cosmetic Science / Gustavo S Luengo, Anthony Galliano -- Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development / Matthew S Lamm -- Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials / Katharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, Kumar Virwani -- Nanomechanical Characterization of Biomaterial Surfaces / Klaus Wormuth, Greg Haugstad Scanning probe microscopy / Industrial applications Materials / Microscopy Nanostrukturiertes Material (DE-588)4342626-8 gnd rswk-swf Industrie (DE-588)4026779-9 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s Nanostrukturiertes Material (DE-588)4342626-8 s Industrie (DE-588)4026779-9 s DE-604 Yablon, Dalia G. Sonstige oth Erscheint auch als Druckausgabe 978-1-118-28823-8 https://onlinelibrary.wiley.com/doi/book/10.1002/9781118723111 Verlag Volltext |
| spellingShingle | Scanning probe microscopy in industrial applications nanomechanical characterization Overview of Atomic Force Microscopy / Dalia G Yablon -- Understanding the Tip-Sample Contact / Tevis D B Jacobs, C Mathew Mate, Kevin T Turner, Robert W Carpick -- Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves / Sudharsan Balasubramaniam, Daniel Kiracofe, Arvind Raman -- Phase Imaging / Dalia G Yablon, Greg Haugstad -- Dynamic Contact AFM Methods for Nanomechanical Properties / Donna C Hurley, Jason P Killgore -- Guide to Best Practices for AFM Users / Greg Haugstad -- Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution / Steve J Bull -- Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry / Foucher Johann -- Atomic Force Microscopy of Polymers / Andy H Tsou, Dalia G Yablon -- Unraveling Links between Food Structure and Function with Probe Microscopy / A Patrick Gunning, Victor J Morris -- Microcantilever Sensors for Petrochemical Applications / Alan M Schilowitz -- Applications of Scanning Probe Methods in Cosmetic Science / Gustavo S Luengo, Anthony Galliano -- Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development / Matthew S Lamm -- Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials / Katharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, Kumar Virwani -- Nanomechanical Characterization of Biomaterial Surfaces / Klaus Wormuth, Greg Haugstad Scanning probe microscopy / Industrial applications Materials / Microscopy Nanostrukturiertes Material (DE-588)4342626-8 gnd Industrie (DE-588)4026779-9 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4342626-8 (DE-588)4026779-9 (DE-588)4330328-6 (DE-588)4143413-4 |
| title | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_auth | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_exact_search | Scanning probe microscopy in industrial applications nanomechanical characterization |
| title_full | Scanning probe microscopy in industrial applications nanomechanical characterization edited by Dalia G. Yablon |
| title_fullStr | Scanning probe microscopy in industrial applications nanomechanical characterization edited by Dalia G. Yablon |
| title_full_unstemmed | Scanning probe microscopy in industrial applications nanomechanical characterization edited by Dalia G. Yablon |
| title_short | Scanning probe microscopy in industrial applications |
| title_sort | scanning probe microscopy in industrial applications nanomechanical characterization |
| title_sub | nanomechanical characterization |
| topic | Scanning probe microscopy / Industrial applications Materials / Microscopy Nanostrukturiertes Material (DE-588)4342626-8 gnd Industrie (DE-588)4026779-9 gnd Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Scanning probe microscopy / Industrial applications Materials / Microscopy Nanostrukturiertes Material Industrie Rastersondenmikroskopie Aufsatzsammlung |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9781118723111 |
| work_keys_str_mv | AT yablondaliag scanningprobemicroscopyinindustrialapplicationsnanomechanicalcharacterization |