Holdings: Electromigration failure by shape change of voids in bamboo lines

Electromigration failure by shape change of voids in bamboo lines:

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Bibliographic Details
Format:	Electronic eBook
Language:	English
Published:	Woodbury, NY American Inst. of Physics 1994
Online Access:	Volltext // Exemplar mit der Signatur: München, Bayerische Staatsbibliothek -- 4 Z 53.18-76,3/4#S.1563-1571
Item Description:	In: Journal of applied physics, Vol. 104, No. 17, 1996. - Woodbury, NY : American Inst. of Physics
Physical Description:	1 Online-Ressource (S. 1563 - 1571) Ill., graph. Darst.

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MARC


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Record in the Search Index

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spellingShingle	Electromigration failure by shape change of voids in bamboo lines
title	Electromigration failure by shape change of voids in bamboo lines
title_auth	Electromigration failure by shape change of voids in bamboo lines
title_exact_search	Electromigration failure by shape change of voids in bamboo lines
title_full	Electromigration failure by shape change of voids in bamboo lines E. Arzt ...
title_fullStr	Electromigration failure by shape change of voids in bamboo lines E. Arzt ...
title_full_unstemmed	Electromigration failure by shape change of voids in bamboo lines E. Arzt ...
title_short	Electromigration failure by shape change of voids in bamboo lines
title_sort	electromigration failure by shape change of voids in bamboo lines
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