Electromigration failure by shape change of voids in bamboo lines:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Woodbury, NY
American Inst. of Physics
1994
|
| Online-Zugang: | Volltext // Exemplar mit der Signatur: München, Bayerische Staatsbibliothek -- 4 Z 53.18-76,3/4#S.1563-1571 |
| Beschreibung: | In: Journal of applied physics, Vol. 104, No. 17, 1996. - Woodbury, NY : American Inst. of Physics |
| Beschreibung: | 1 Online-Ressource (S. 1563 - 1571) Ill., graph. Darst. |
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| spelling | Electromigration failure by shape change of voids in bamboo lines E. Arzt ... Woodbury, NY American Inst. of Physics 1994 1 Online-Ressource (S. 1563 - 1571) Ill., graph. Darst. txt rdacontent c rdamedia cr rdacarrier In: Journal of applied physics, Vol. 104, No. 17, 1996. - Woodbury, NY : American Inst. of Physics Arzt, Eduard 1956- Sonstige (DE-588)113271387 oth Elektronische Reproduktion München : Bayerische Staatsbibliothek, 2014 urn:nbn:de:bvb:12-bsb00086573-2 http://mdz-nbn-resolving.de/urn:nbn:de:bvb:12-bsb00086573-2 Resolving-System kostenfrei Volltext // Exemplar mit der Signatur: München, Bayerische Staatsbibliothek -- 4 Z 53.18-76,3/4#S.1563-1571 |
| spellingShingle | Electromigration failure by shape change of voids in bamboo lines |
| title | Electromigration failure by shape change of voids in bamboo lines |
| title_auth | Electromigration failure by shape change of voids in bamboo lines |
| title_exact_search | Electromigration failure by shape change of voids in bamboo lines |
| title_full | Electromigration failure by shape change of voids in bamboo lines E. Arzt ... |
| title_fullStr | Electromigration failure by shape change of voids in bamboo lines E. Arzt ... |
| title_full_unstemmed | Electromigration failure by shape change of voids in bamboo lines E. Arzt ... |
| title_short | Electromigration failure by shape change of voids in bamboo lines |
| title_sort | electromigration failure by shape change of voids in bamboo lines |
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