(1994). Electromigration failure by shape change of voids in bamboo lines. American Inst. of Physics.
Chicago Style (17th ed.) CitationElectromigration Failure by Shape Change of Voids in Bamboo Lines. Woodbury, NY: American Inst. of Physics, 1994.
MLA (9th ed.) CitationElectromigration Failure by Shape Change of Voids in Bamboo Lines. American Inst. of Physics, 1994.
Warning: These citations may not always be 100% accurate.