APA (7th ed.) Citation

Hermann, P. (2012). Stress characterization and imaging of semiconductor nanostructures by far-field and near-field Raman spectroscopy.

Chicago Style (17th ed.) Citation

Hermann, Peter. Stress Characterization and Imaging of Semiconductor Nanostructures by Far-field and Near-field Raman Spectroscopy. 2012.

MLA (9th ed.) Citation

Hermann, Peter. Stress Characterization and Imaging of Semiconductor Nanostructures by Far-field and Near-field Raman Spectroscopy. 2012.

Warning: These citations may not always be 100% accurate.