Hermann, P. (2012). Stress characterization and imaging of semiconductor nanostructures by far-field and near-field Raman spectroscopy.
Chicago-Zitierstil (17. Ausg.)Hermann, Peter. Stress Characterization and Imaging of Semiconductor Nanostructures by Far-field and Near-field Raman Spectroscopy. 2012.
MLA-Zitierstil (9. Ausg.)Hermann, Peter. Stress Characterization and Imaging of Semiconductor Nanostructures by Far-field and Near-field Raman Spectroscopy. 2012.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.