(2012). Optical imaging and metrology: Advanced technologies. Wiley-VCH.
Chicago Style (17th ed.) CitationOptical Imaging and Metrology: Advanced Technologies. Weinheim: Wiley-VCH, 2012.
MLA (9th ed.) CitationOptical Imaging and Metrology: Advanced Technologies. Wiley-VCH, 2012.
Warning: These citations may not always be 100% accurate.